Skip to main navigation
Skip to search
Skip to main content
Princeton University Home
Help & FAQ
Home
Profiles
Research units
Facilities
Projects
Research output
Search by expertise, name or affiliation
Electron diffraction conditions and surface imaging in reflection electron microscopy
Nan Yao
, J. M. Cowley
Research output
:
Contribution to journal
›
Article
›
peer-review
Overview
Fingerprint
Fingerprint
Dive into the research topics of 'Electron diffraction conditions and surface imaging in reflection electron microscopy'. Together they form a unique fingerprint.
Sort by
Weight
Alphabetically
Engineering & Materials Science
Electron diffraction
100%
Electron microscopy
97%
Imaging techniques
57%
Reflection high energy electron diffraction
31%
Inelastic scattering
28%
Electron scattering
27%
Surface structure
18%
Diffraction
16%
Atoms
15%
Scattering
14%
Chemical Compounds
Electron Diffraction
77%
Electron Microscopy
65%
Reflection
60%
Resonance
45%
Electron Scattering
29%
Surface
24%
Reflectivity
21%
Surface Structure
18%
Physics & Astronomy
electron microscopy
65%
electron diffraction
64%
augmentation
15%
image contrast
14%
inelastic scattering
11%
electron scattering
11%
reflectance
8%
diffraction
6%
scattering
6%
atoms
6%