Electrical properties of K-doped superfulleride thin films

Nathan Swami, Mark E. Thompson, Bruce E. Koel

Research output: Contribution to journalArticlepeer-review

4 Scopus citations

Abstract

The electric conductivity of thin films of C60, K-doped superfullerides was measured. The horizontal distance in between the conductivity minimum at 4×10-3 Ωcm corresponding to 380 angstroms K3C60 was applied to assign an average stoichiometry to the KxC60 phases. Based on this assignment, the change in lattice parameter on the formation of the fulleride phases is assumed to be minimal compared to the C60 lattice parameter.

Original languageEnglish (US)
Pages (from-to)3696-3700
Number of pages5
JournalJournal of Applied Physics
Volume85
Issue number7
DOIs
StatePublished - Apr 1 1999

All Science Journal Classification (ASJC) codes

  • General Physics and Astronomy

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