Electrical properties of K-doped superfulleride thin films

Nathan Swami; Mark E. Thompson; Bruce E. Koel

doi:10.1063/1.369734

Electrical properties of K-doped superfulleride thin films

Nathan Swami, Mark E. Thompson, Bruce E. Koel

Research output: Contribution to journal › Article › peer-review

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Abstract

The electric conductivity of thin films of C₆₀, K-doped superfullerides was measured. The horizontal distance in between the conductivity minimum at 4×10^-3 Ωcm corresponding to 380 angstroms K₃C₆₀ was applied to assign an average stoichiometry to the K_xC₆₀ phases. Based on this assignment, the change in lattice parameter on the formation of the fulleride phases is assumed to be minimal compared to the C₆₀ lattice parameter.

Original language	English (US)
Pages (from-to)	3696-3700
Number of pages	5
Journal	Journal of Applied Physics
Volume	85
Issue number	7
DOIs	https://doi.org/10.1063/1.369734
State	Published - Apr 1 1999

All Science Journal Classification (ASJC) codes

General Physics and Astronomy

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10.1063/1.369734

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title = "Electrical properties of K-doped superfulleride thin films",

abstract = "The electric conductivity of thin films of C60, K-doped superfullerides was measured. The horizontal distance in between the conductivity minimum at 4×10-3 Ωcm corresponding to 380 angstroms K3C60 was applied to assign an average stoichiometry to the KxC60 phases. Based on this assignment, the change in lattice parameter on the formation of the fulleride phases is assumed to be minimal compared to the C60 lattice parameter.",

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AU - Koel, Bruce E.

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N2 - The electric conductivity of thin films of C60, K-doped superfullerides was measured. The horizontal distance in between the conductivity minimum at 4×10-3 Ωcm corresponding to 380 angstroms K3C60 was applied to assign an average stoichiometry to the KxC60 phases. Based on this assignment, the change in lattice parameter on the formation of the fulleride phases is assumed to be minimal compared to the C60 lattice parameter.

AB - The electric conductivity of thin films of C60, K-doped superfullerides was measured. The horizontal distance in between the conductivity minimum at 4×10-3 Ωcm corresponding to 380 angstroms K3C60 was applied to assign an average stoichiometry to the KxC60 phases. Based on this assignment, the change in lattice parameter on the formation of the fulleride phases is assumed to be minimal compared to the C60 lattice parameter.

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Electrical properties of K-doped superfulleride thin films

Abstract

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