Elastic electron fine structure: First principle calculation

B. Y. Lin; A. Kahn

doi:10.1016/0039-6028(89)90650-X

Elastic electron fine structure: First principle calculation

B. Y. Lin, A. Kahn

Research output: Contribution to journal › Article › peer-review

4 Scopus citations

Abstract

A first principle electron multiple scattering calculation is carried out for a two atom system to obtain total elastic scattering intensity as a function of energy. The total elastic electron scattering intensity from an amorphous material (Si) is calculated by averaging that from two atom systems. An excellent match is obtained between the calculated and experimental result. The calculation supports our interpretation of the fine structure found in the elastically reflected electron intensity and provides the theoretical foundation for the practical application of the technique in surface and interface studies.

Original language	English (US)
Pages (from-to)	160-172
Number of pages	13
Journal	Surface Science
Volume	216
Issue number	1-2
DOIs	https://doi.org/10.1016/0039-6028(89)90650-X
State	Published - Jun 1 1989

All Science Journal Classification (ASJC) codes

Condensed Matter Physics
Surfaces and Interfaces
Surfaces, Coatings and Films
Materials Chemistry

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10.1016/0039-6028(89)90650-X

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title = "Elastic electron fine structure: First principle calculation",

abstract = "A first principle electron multiple scattering calculation is carried out for a two atom system to obtain total elastic scattering intensity as a function of energy. The total elastic electron scattering intensity from an amorphous material (Si) is calculated by averaging that from two atom systems. An excellent match is obtained between the calculated and experimental result. The calculation supports our interpretation of the fine structure found in the elastically reflected electron intensity and provides the theoretical foundation for the practical application of the technique in surface and interface studies.",

author = "Lin, {B. Y.} and A. Kahn",

note = "Funding Information: Thanks are due to Joao f=onde for providing the ~o~hous Si samples for the experiment. The support of this work by a grant of the National Science Foundation (DMR-8709531) is gratefully acknowledged. Partial support was also provided by General Electric and General Motors Corporation through the Presidential Young Investigator Award program.",

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doi = "10.1016/0039-6028(89)90650-X",

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T1 - Elastic electron fine structure

T2 - First principle calculation

AU - Lin, B. Y.

AU - Kahn, A.

N1 - Funding Information: Thanks are due to Joao f=onde for providing the ~o~hous Si samples for the experiment. The support of this work by a grant of the National Science Foundation (DMR-8709531) is gratefully acknowledged. Partial support was also provided by General Electric and General Motors Corporation through the Presidential Young Investigator Award program.

PY - 1989/6/1

Y1 - 1989/6/1

N2 - A first principle electron multiple scattering calculation is carried out for a two atom system to obtain total elastic scattering intensity as a function of energy. The total elastic electron scattering intensity from an amorphous material (Si) is calculated by averaging that from two atom systems. An excellent match is obtained between the calculated and experimental result. The calculation supports our interpretation of the fine structure found in the elastically reflected electron intensity and provides the theoretical foundation for the practical application of the technique in surface and interface studies.

AB - A first principle electron multiple scattering calculation is carried out for a two atom system to obtain total elastic scattering intensity as a function of energy. The total elastic electron scattering intensity from an amorphous material (Si) is calculated by averaging that from two atom systems. An excellent match is obtained between the calculated and experimental result. The calculation supports our interpretation of the fine structure found in the elastically reflected electron intensity and provides the theoretical foundation for the practical application of the technique in surface and interface studies.

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U2 - 10.1016/0039-6028(89)90650-X

DO - 10.1016/0039-6028(89)90650-X

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VL - 216

SP - 160

EP - 172

JO - Surface Science

JF - Surface Science

IS - 1-2

ER -

Elastic electron fine structure: First principle calculation

Abstract

All Science Journal Classification (ASJC) codes

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