Effects of sample size and field orientation on pseudo-hall voltage in micronscale nickel thin-film squares

Y. Q. Jia, Linshu Kong, Rick C. Shi, Stephen Y. Chou

Research output: Contribution to journalArticle

4 Scopus citations

Abstract

Pseudo-Hall effect (PHE) in Ni thin-film squares of 1-5 μm size is measured with a constant current through two leads along one diagonal of the square and the voltage output from leads along the other diagonal. The PHE voltage in response to an in-plane magnetic field depends on the square size and field orientation. The minimum PHE voltage at low field is close to zero only with the 2 μm square containing four symmetrical closure domains leading to a 600% relative change in PHE voltage. The PHE signal is found the largest when the field direction is along the square side while the smallest when along the square diagonal.

Original languageEnglish (US)
Pages (from-to)5475-5477
Number of pages3
JournalJournal of Applied Physics
Volume81
Issue number8 PART 2B
DOIs
StatePublished - Apr 15 1997
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

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