Original language | English (US) |
---|---|
Article number | 5401039 |
Pages (from-to) | 345-346 |
Number of pages | 2 |
Journal | IEEE Transactions on Very Large Scale Integration (VLSI) Systems |
Volume | 18 |
Issue number | 3 |
DOIs | |
State | Published - Mar 2010 |
All Science Journal Classification (ASJC) codes
- Software
- Hardware and Architecture
- Electrical and Electronic Engineering
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In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Vol. 18, No. 3, 5401039, 03.2010, p. 345-346.
Research output: Contribution to journal › Editorial › peer-review
TY - JOUR
T1 - Editorial
T2 - New associate editor appointments
AU - Jha, Niraj K.
N1 - Funding Information: NIRAJ K. JHA, Editor-in-Chief Department of Electrical Engineering Princeton University Princeton, NJ 08544 USA Niraj K. Jha (S’85–M’85–SM’93–F’98) received the B.Tech. degree in electronics and electrical communication engineering from Indian Institute of Technology, Kharagpur, India, in 1981, the M.S. degree in electrical engineering from S.U.N.Y., Stony Brook, NY, in 1982, and the Ph.D. degree in electrical engineering from University of Illinois, Urbana, IL, in 1985. He is a Professor with the Department of Electrical Engineering, Princeton University, Princeton, NJ. He has coauthored four books titled Testing and Reliable Design of CMOS Circuits (Kluwer, 1990), High-Level Power Analysis and Optimization (Kluwer, 1998), Testing of Digital Systems (Cambridge University Press, 2003), and Switching and Finite Automata Theory, 3rd ed. (Cam-bridge University Press, 2009). He has also authored ten book chapters. He has authored or coau-thored more than 330 technical papers. He holds 13 U.S. patents. His research interests include nanotechnology, low power hardware/software design, computer-aided design of integrated cir-cuits and systems, digital system testing and secure computing. Dr. Jha was a recipient of the AT&T Foundation Award and NEC Preceptorship Award for research excellence, NCR Award for teaching excellence, and Princeton University Graduate Mentoring Award. He has coauthored seven papers which have won the Best Paper Award at ICCD’93, FTCS’97, ICVLSID’98, DAC’99, PDCS’02, ICVLSID’03, CODES’06, and ICCD’09. A paper of his was selected for ‘‘The Best of ICCAD: A collection of the best IEEE International Conference on Computer-Aided Design papers of the past 20 years,’’ two papers by IEEE Micro Magazine as one of the top picks from the 2005 and 2007 Computer Architecture conferences, and two others as being among the most influential papers of the last 10 years at IEEE Design Automation and Test in Europe Conference. He is currently serving as the Editor-in-Chief of IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS and an Associate Editor of the IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS—I: REGULAR PAPERS, the IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, and the Journal of Low Power Electronics. He has served as an Associate Editor of IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS—II: EXPRESS BRIEFS and the Journal of Electronic Testing: Theory and Applications in the past. He has also served as the Program Chairman of the 1992 Workshop on Fault-Tolerant Parallel and Distributed Systems, the 2004 International Conference on Embedded and Ubiquitous Computing, and the 2010 International Conference on VLSI Design. He has served as the Director of the Center for Embedded System-on-a-Chip Design funded by New Jersey Commission on Science and Technology. He is a Fellow of the ACM. Funding Information: Dr. Chang was a recipient of the National Science Council Research Award in 1997 and 1998, the Distinguished Teaching Award, the Outstanding Research Project Award, and the Distinguished Teacher Evaluation Award from National Chung Hsing University in 2004, 2006, and 2009, respectively. He was listed in the Marquis Who’s Who in the World 2000. He is a member of Tau Beta Pi. He has been a Member of VLSI Systems and Applications Technical Committee, and Nanoelectronics and Gigascale Systems Technical Committee, IEEE Circuits and Systems Society since 2004 and 2009, respectively. He also served as Technical Program Committee Member for many conferences.
PY - 2010/3
Y1 - 2010/3
UR - http://www.scopus.com/inward/record.url?scp=77649190614&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=77649190614&partnerID=8YFLogxK
U2 - 10.1109/TVLSI.2009.2039658
DO - 10.1109/TVLSI.2009.2039658
M3 - Editorial
AN - SCOPUS:77649190614
SN - 1063-8210
VL - 18
SP - 345
EP - 346
JO - IEEE Transactions on Very Large Scale Integration (VLSI) Systems
JF - IEEE Transactions on Very Large Scale Integration (VLSI) Systems
IS - 3
M1 - 5401039
ER -