Dynamical analysis of low-energy electron diffraction intensities from CdSe(1010)

C. B. Duke; A. Paton; Y. R. Wang; K. Stiles; A. Kahn

doi:10.1016/0039-6028(88)90569-9

Dynamical analysis of low-energy electron diffraction intensities from CdSe(1010)

C. B. Duke, A. Paton, Y. R. Wang, K. Stiles, A. Kahn

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22 Scopus citations

Abstract

The measurement of the intensities of 14 diffracted beams of low-energy (40≤E≤230 eV) electrons normally incident on CdSe(1010) is reported. The temperature of the CdSe surface during the measurements was T≅125 K. The surface were prepared by in situ cleavage within the ultrahigh vacuum system used to perform the intensity measurements. The measured intensities were analyzed using a relativistic, Hara-exchange electron-ion-core potential and an X-ray R-factor structure analysis methodology. This analysis leads to a best-fit structure characterized by a bond-length-conserving rotation of the dimers in the top layer by ω = 23°, Se outward and Cd inward. The X-ray R-factor for this structure is R_x = 0.23 identical to the value obtained for the best-fit surface-structure of the InAs(110) which is the zincblende-structure isoelectronic counterpart of wurtzite-structure CdSe.

Original language	English (US)
Pages (from-to)	11-23
Number of pages	13
Journal	Surface Science
Volume	197
Issue number	1-2
DOIs	https://doi.org/10.1016/0039-6028(88)90569-9
State	Published - 1988

All Science Journal Classification (ASJC) codes

Condensed Matter Physics
Surfaces and Interfaces
Surfaces, Coatings and Films
Materials Chemistry

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10.1016/0039-6028(88)90569-9

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@article{20a1c11e0da64469b27c4c143b38d259,

title = "Dynamical analysis of low-energy electron diffraction intensities from CdSe(1010)",

abstract = "The measurement of the intensities of 14 diffracted beams of low-energy (40≤E≤230 eV) electrons normally incident on CdSe(1010) is reported. The temperature of the CdSe surface during the measurements was T≅125 K. The surface were prepared by in situ cleavage within the ultrahigh vacuum system used to perform the intensity measurements. The measured intensities were analyzed using a relativistic, Hara-exchange electron-ion-core potential and an X-ray R-factor structure analysis methodology. This analysis leads to a best-fit structure characterized by a bond-length-conserving rotation of the dimers in the top layer by ω = 23°, Se outward and Cd inward. The X-ray R-factor for this structure is Rx = 0.23 identical to the value obtained for the best-fit surface-structure of the InAs(110) which is the zincblende-structure isoelectronic counterpart of wurtzite-structure CdSe.",

author = "Duke, {C. B.} and A. Paton and Wang, {Y. R.} and K. Stiles and A. Kahn",

note = "Funding Information: This work was partial|y supported by a grant of the National Science Foundation (DMR-8406820).",

year = "1988",

doi = "10.1016/0039-6028(88)90569-9",

language = "English (US)",

volume = "197",

pages = "11--23",

journal = "Surface Science",

issn = "0039-6028",

publisher = "Elsevier",

number = "1-2",

}

TY - JOUR

T1 - Dynamical analysis of low-energy electron diffraction intensities from CdSe(1010)

AU - Duke, C. B.

AU - Paton, A.

AU - Wang, Y. R.

AU - Stiles, K.

AU - Kahn, A.

N1 - Funding Information: This work was partial|y supported by a grant of the National Science Foundation (DMR-8406820).

PY - 1988

Y1 - 1988

N2 - The measurement of the intensities of 14 diffracted beams of low-energy (40≤E≤230 eV) electrons normally incident on CdSe(1010) is reported. The temperature of the CdSe surface during the measurements was T≅125 K. The surface were prepared by in situ cleavage within the ultrahigh vacuum system used to perform the intensity measurements. The measured intensities were analyzed using a relativistic, Hara-exchange electron-ion-core potential and an X-ray R-factor structure analysis methodology. This analysis leads to a best-fit structure characterized by a bond-length-conserving rotation of the dimers in the top layer by ω = 23°, Se outward and Cd inward. The X-ray R-factor for this structure is Rx = 0.23 identical to the value obtained for the best-fit surface-structure of the InAs(110) which is the zincblende-structure isoelectronic counterpart of wurtzite-structure CdSe.

AB - The measurement of the intensities of 14 diffracted beams of low-energy (40≤E≤230 eV) electrons normally incident on CdSe(1010) is reported. The temperature of the CdSe surface during the measurements was T≅125 K. The surface were prepared by in situ cleavage within the ultrahigh vacuum system used to perform the intensity measurements. The measured intensities were analyzed using a relativistic, Hara-exchange electron-ion-core potential and an X-ray R-factor structure analysis methodology. This analysis leads to a best-fit structure characterized by a bond-length-conserving rotation of the dimers in the top layer by ω = 23°, Se outward and Cd inward. The X-ray R-factor for this structure is Rx = 0.23 identical to the value obtained for the best-fit surface-structure of the InAs(110) which is the zincblende-structure isoelectronic counterpart of wurtzite-structure CdSe.

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U2 - 10.1016/0039-6028(88)90569-9

DO - 10.1016/0039-6028(88)90569-9

M3 - Article

AN - SCOPUS:0009408039

SN - 0039-6028

VL - 197

SP - 11

EP - 23

JO - Surface Science

JF - Surface Science

IS - 1-2

ER -

Dynamical analysis of low-energy electron diffraction intensities from CdSe(1010)

Abstract

All Science Journal Classification (ASJC) codes

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