Dynamical analysis of low-energy electron diffraction intensities from CdSe(1010)

C. B. Duke, A. Paton, Y. R. Wang, K. Stiles, A. Kahn

Research output: Contribution to journalArticle

20 Scopus citations

Abstract

The measurement of the intensities of 14 diffracted beams of low-energy (40≤E≤230 eV) electrons normally incident on CdSe(1010) is reported. The temperature of the CdSe surface during the measurements was T≅125 K. The surface were prepared by in situ cleavage within the ultrahigh vacuum system used to perform the intensity measurements. The measured intensities were analyzed using a relativistic, Hara-exchange electron-ion-core potential and an X-ray R-factor structure analysis methodology. This analysis leads to a best-fit structure characterized by a bond-length-conserving rotation of the dimers in the top layer by ω = 23°, Se outward and Cd inward. The X-ray R-factor for this structure is Rx = 0.23 identical to the value obtained for the best-fit surface-structure of the InAs(110) which is the zincblende-structure isoelectronic counterpart of wurtzite-structure CdSe.

Original languageEnglish (US)
Pages (from-to)11-23
Number of pages13
JournalSurface Science
Volume197
Issue number1-2
DOIs
StatePublished - 1988

All Science Journal Classification (ASJC) codes

  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Materials Chemistry

Fingerprint Dive into the research topics of 'Dynamical analysis of low-energy electron diffraction intensities from CdSe(1010)'. Together they form a unique fingerprint.

  • Cite this