TY - GEN
T1 - Dynamic Uniformity Modeling in Superconductor Manufacturing via Vector Autoregression Analysis
AU - Peng, Shenglin
AU - Li, Mai
AU - Lin, Ying
AU - Feng, Qianmei
AU - Fu, Wenjiang
AU - Galstyan, Eduard
AU - Chen, Siwei
AU - Jain, Rohit
N1 - Publisher Copyright:
© 2022 IISE Annual Conference and Expo 2022. All rights reserved.
PY - 2022
Y1 - 2022
N2 - With high efficiency and low energy loss, high-temperature superconductors (HTS) have demonstrated their profound applications in various fields, such as medical imaging, transportation, accelerators, microwave devices, and power systems. The high-field applications of HTS tapes have raised the demand of producing cost-effective tapes with long lengths in superconductor manufacturing. However, achieving the uniform performance of a long HTS tape is challenging due to the unstable growth conditions in the manufacturing process. In addition, the identification of parameters in the growth conditions that affect the uniformity of HTS tapes remains an unexplored question. To model and analyze the uniformity of HTS tapes, we develop a dynamic uniformity modeling framework that integrates the dynamic statistical uniformity measures and the vector autoregression analysis for identifying important process parameters associated with the tape uniformity. The proposed method is applied to real data from HTS tapes and the key process parameters, such as the tension and substrate temperature, are identified.
AB - With high efficiency and low energy loss, high-temperature superconductors (HTS) have demonstrated their profound applications in various fields, such as medical imaging, transportation, accelerators, microwave devices, and power systems. The high-field applications of HTS tapes have raised the demand of producing cost-effective tapes with long lengths in superconductor manufacturing. However, achieving the uniform performance of a long HTS tape is challenging due to the unstable growth conditions in the manufacturing process. In addition, the identification of parameters in the growth conditions that affect the uniformity of HTS tapes remains an unexplored question. To model and analyze the uniformity of HTS tapes, we develop a dynamic uniformity modeling framework that integrates the dynamic statistical uniformity measures and the vector autoregression analysis for identifying important process parameters associated with the tape uniformity. The proposed method is applied to real data from HTS tapes and the key process parameters, such as the tension and substrate temperature, are identified.
KW - Critical current
KW - dynamic uniformity modeling
KW - superconductor manufacturing
KW - vector autoregression analysis
UR - https://www.scopus.com/pages/publications/85137177602
UR - https://www.scopus.com/inward/citedby.url?scp=85137177602&partnerID=8YFLogxK
M3 - Conference contribution
AN - SCOPUS:85137177602
T3 - IISE Annual Conference and Expo 2022
BT - IISE Annual Conference and Expo 2022
A2 - Ellis, K.
A2 - Ferrell, W.
A2 - Knapp, J.
PB - Institute of Industrial and Systems Engineers, IISE
T2 - IISE Annual Conference and Expo 2022
Y2 - 21 May 2022 through 24 May 2022
ER -