Scaling behavior of the island size distribution through a universal scaling function [Formula presented] is demonstrated for submonolayer pentacene islands in the aggregation regime ([Formula presented]) grown on oxidized silicon surfaces. The distribution of [Formula presented] suggests that four molecules constitute the smallest stable island. The structure factor [Formula presented] of the submonolayer films calculated from AFM micrographs compares well with diffuse x-ray intensities from in situ experiments. The structure factor was decomposed into the contribution from the average island shape and the interisland distribution confirming that a unique characteristic length scale regulates the growth dynamics.
|Original language||English (US)|
|Journal||Physical review letters|
|State||Published - 2003|
All Science Journal Classification (ASJC) codes
- Physics and Astronomy(all)