Dynamic scaling, island size distribution, and morphology in the aggregation regime of submonolayer pentacene films

Ricardo Ruiz, Bert Nickel, Norbert Koch, Leonard C. Feldman, Richard F. Haglund, Antoine Kahn, Fereydoon Family, Giacinto Scoles

Research output: Contribution to journalArticle

162 Scopus citations

Abstract

Scaling behavior of the island size distribution through a universal scaling function [Formula presented] is demonstrated for submonolayer pentacene islands in the aggregation regime ([Formula presented]) grown on oxidized silicon surfaces. The distribution of [Formula presented] suggests that four molecules constitute the smallest stable island. The structure factor [Formula presented] of the submonolayer films calculated from AFM micrographs compares well with diffuse x-ray intensities from in situ experiments. The structure factor was decomposed into the contribution from the average island shape and the interisland distribution confirming that a unique characteristic length scale regulates the growth dynamics.

Original languageEnglish (US)
JournalPhysical review letters
Volume91
Issue number13
DOIs
StatePublished - 2003

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

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