@article{7b1e36b5ae18423e969bf345acde9a1b,
title = "Dislocation arrangements in pentacene thin films",
abstract = "We have studied the growth of pentacene films (2-8 monolayers) on modified Si-wafer surfaces by means of synchrotron x-ray diffraction. The diffraction data reveal a nonthermal damping of the (coherent) Bragg reflection intensities according to an exponential dependence on the 3/2 power of the momentum transfer. The simultaneous presence of strong diffuse scattering centered around the Bragg positions indicates the presence of local defects. A quantitative analysis of the Bragg and diffuse scattering allows us to identify screw and edge dislocations as the main defects on the molecular scale. We quantify dislocation densities as a function of substrate termination.",
author = "B. Nickel and R. Barabash and R. Ruiz and N. Koch and Antoine Kahn and Feldman, \{L. C.\} and Haglund, \{R. F.\} and G. Scoles",
note = "Funding Information: We thank the NSLS management and the beamline staff and scientists from Exxon (Steven Bennett and Rainer Kolb) for continuous support and Ben Ocko for providing access to a closed cycle refrigerator. Max Shtein from the Princeton University Electrical Engineering is acknowledged for help with the preparation of the OTS termination. Fatih Danisman from the Princeton University Chemistry Department is acknowledged for help with organizing the synchrotron experiments. The work at Princeton and at the NSLS was supported by the DOE under Grant No. DE-FG02-93ER45503 and by the NSF (DMR-0097133). B.N. acknowledges support from the Deutsche Forschungsgemeinschaft (DFG Ni632/1-1). R.B. acknowledges the support of the Director, Office of Science, Office of Basic Energy Sciences, U.S. Department of Energy, under Contract No. DE-AC05-00OR22725 with UT-Battelle.",
year = "2004",
month = sep,
doi = "10.1103/PhysRevB.70.125401",
language = "English (US)",
volume = "70",
pages = "125401--1--125401--7",
journal = "Physical Review B - Condensed Matter and Materials Physics",
issn = "0163-1829",
publisher = "American Physical Society",
number = "12",
}