Discriminative k metrics and the Chan-Vese model for object detection and segmentation

Arthur Szlam, Guillermo Sapiro

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

In this work, a modification of the k q-flats framework for pattern classification introduced in [9] is used for pixelwise object detection. We include a preliminary discussion of augmenting this method is with a Chan-Vese-like geometric regularization

Original languageEnglish (US)
Title of host publicationWavelets XIII
DOIs
StatePublished - 2009
EventWavelets XIII - San Diego, CA, United States
Duration: Aug 2 2009Aug 4 2009

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume7446
ISSN (Print)0277-786X

Other

OtherWavelets XIII
Country/TerritoryUnited States
CitySan Diego, CA
Period8/2/098/4/09

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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