Discovery of narrow-band photoionization resonance transition at 0.65 eV in AlGaAs/GaAs heterostructures

M. Spector, L. N. Pfeiffer, J. C. Licini, K. W. West, G. A. Baraff

Research output: Contribution to journalArticlepeer-review

3 Scopus citations

Abstract

We have discovered an alternate pathway below the usual 1.1 eV threshold for Si photoionization from the DX ground state in AlGaAs. This alternate photpath proceeds via a 0.1 eV wide resonance at 0.65 eV. The ionization rate for this path scales as the square of the resonance photon intensity, not linearly with the intensity as does the usual 1.1 eV threshold path. Photons at 0.5 eV accompanied by weak photon fluxes at 0.65 eV do scale linearly with 0.5 eV intensity showing the 0.65 eV state is a short-lived resonant intermediate level.

Original languageEnglish (US)
Pages (from-to)903-906
Number of pages4
JournalPhysical review letters
Volume71
Issue number6
DOIs
StatePublished - 1993
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • General Physics and Astronomy

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