Direct optical measurement of the valence band offset of p+ Si1-x-yGexCy/p- Si(100) by heterojunction internal photoemission

C. L. Chang, L. P. Rokhinson, J. C. Sturm

Research output: Contribution to journalArticlepeer-review

13 Scopus citations

Fingerprint

Dive into the research topics of 'Direct optical measurement of the valence band offset of p+ Si1-x-yGexCy/p- Si(100) by heterojunction internal photoemission'. Together they form a unique fingerprint.

Keyphrases

Engineering

Material Science