Abstract
Optical absorption measurements have been performed to study the effect of substitutional carbon on the valence band offset of compressively strained p+ Si1-x-yGexCy/(100) p- Si. The compressively strained p+ Si1-x-yGexCy/(100) p- Si heterojunction internal photoemission structures were grown by rapid thermal chemical vapor deposition with substitutional carbon levels up to 2.5%. Carbon decreased the valence band offset by 26±1meV/% substitutional carbon. Based on previous reports of the effect of carbon on the band gap of Si1-x-yGexCy, our work suggests that the effect of carbon incorporation on the band alignment of compressively strained Si1-x-yGexCy/Si is to reduce the valence band offset, with a negligible effect on the conduction band alignment.
Original language | English (US) |
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Pages (from-to) | 3568-3570 |
Number of pages | 3 |
Journal | Applied Physics Letters |
Volume | 73 |
Issue number | 24 |
DOIs | |
State | Published - 1998 |
All Science Journal Classification (ASJC) codes
- Physics and Astronomy (miscellaneous)