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Diffusion enhanced carbon loss from SiGeC layers due to oxidation
M. S. Carroll
,
J. C. Sturm
, E. Napolitani
, D. De Salvador
, M. Berti
, J. Stangl
, G. Bauer
, D. J. Tweet
Electrical and Computer Engineering
Keller Center for Innovation in Engineering Education
Princeton Materials Institute
Research output
:
Contribution to journal
›
Article
›
peer-review
12
Scopus citations
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Engineering
Annealing Time
100%
Chemical Engineering
Secondary Ion Mass Spectrometry
100%
Keyphrases
Annealing Time
33%
Cap Thickness
33%