Dielectric properties of Ta2O5-BN polycrystalline ceramics

R. J. Cava, J. J. Krajewski

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The dielectric properties of (Ta2O5)1 x(BN)x polycrystalline ceramics are reported for 0.0 < x < 0.25. Measurements were made at 1 MHz and temperatures between O and 100°C. The dielectric constant is moderately enhanced in the high temperature tantalum oxide phase at low BN concentrations; it then decreases to an essentially composition-independent value at higher concentrations where the low temperature form of tantalum oxide is stabilized. In the low temperature form, above x = 0.05, there is a significant decrease in the temperature coefficient of the dielectric constant with increas-ing BN content.

Original languageEnglish (US)
Pages (from-to)591-596
Number of pages6
JournalMaterials Research Bulletin
Issue number4
StatePublished - 1998

All Science Journal Classification (ASJC) codes

  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering
  • General Materials Science


  • A. ceramics
  • A. dielectric materials
  • D. dielectric properties


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