Dielectric properties of Ta2O5-BN polycrystalline ceramics

Robert Joseph Cava, J. J. Krajewski

Research output: Contribution to journalArticle

1 Scopus citations

Abstract

The dielectric properties of (Ta2O5)1 x(BN)x polycrystalline ceramics are reported for 0.0 < x < 0.25. Measurements were made at 1 MHz and temperatures between O and 100°C. The dielectric constant is moderately enhanced in the high temperature tantalum oxide phase at low BN concentrations; it then decreases to an essentially composition-independent value at higher concentrations where the low temperature form of tantalum oxide is stabilized. In the low temperature form, above x = 0.05, there is a significant decrease in the temperature coefficient of the dielectric constant with increas-ing BN content.

Original languageEnglish (US)
Pages (from-to)591-596
Number of pages6
JournalMaterials Research Bulletin
Volume33
Issue number4
DOIs
StatePublished - Jan 1 1998

All Science Journal Classification (ASJC) codes

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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