Detection of multiple input bridging and stuck-on faults in CMOS logic circuits using current monitoring

Niraj Kumar Jha, Qiao Tong

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Scopus citations

Abstract

Current monitoring is a well-established technique for detecting stuck-on and bridging faults in CMOS logic circuits. When such faults are activated by an appropriate vector, the circuit draws current which is much larger than normal and the fault is detected. The authors first show that any test set, which detects all single stuck-at faults in any irredundant combinational CMOS logic circuit, also detects all multiple stuck-on faults in it using current monitoring. If the constituent gates of the circuit are all primitive CMOS gates (NAND, NOR, NOT) then the authors show that the test set detects all multiple stuck-on and input bridging faults (even if the two types of faults occur simultaneously) with current monitoring. Even when the CMOS circuit is redundant the authors have found that in most cases a test set that detects all detectable single stuck-at faults also has a very high coverage for the multiple stuck-on and input bridging faults and their combinations.

Original languageEnglish (US)
Title of host publicationProceedings of the European Design Automation Conference, EDAC 1990
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages350-354
Number of pages5
ISBN (Electronic)0818620242, 9780818620249
DOIs
StatePublished - Jan 1 1990
Event1990 European Design Automation Conference, EDAC 1990 - Glasgow, United Kingdom
Duration: Mar 12 1990Mar 15 1990

Publication series

NameProceedings of the European Design Automation Conference, EDAC 1990

Conference

Conference1990 European Design Automation Conference, EDAC 1990
CountryUnited Kingdom
CityGlasgow
Period3/12/903/15/90

All Science Journal Classification (ASJC) codes

  • Hardware and Architecture
  • Electrical and Electronic Engineering
  • Control and Optimization
  • Modeling and Simulation

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    Jha, N. K., & Tong, Q. (1990). Detection of multiple input bridging and stuck-on faults in CMOS logic circuits using current monitoring. In Proceedings of the European Design Automation Conference, EDAC 1990 (pp. 350-354). [136672] (Proceedings of the European Design Automation Conference, EDAC 1990). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/EDAC.1990.136672