DETECTING MULTIPLE FAULTS IN CMOS CIRCUITS.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

15 Scopus citations

Abstract

The problem of detecting multiple transistor faults (i. e. , stuck-open and stuck-on faults) in a CMOS circuit is addressed. First, it is shown that a test set that detects single stuck-open faults in any CMOS complex gate also detects all multiple stuck-open faults in it. Then conditions are derived under which a multiple fault, consisting of both stuck-open and stuck-on faults, can be guaranteed to be detectable. The results show that a large percentage of multiple transistor faults in a complex gate are, in fact, detectable. These results are still valid when the complex gate is embedded in a larger CMOS circuit.

Original languageEnglish (US)
Title of host publicationDigest of Papers - International Test Conference
PublisherIEEE
Pages514-519
Number of pages6
ISBN (Print)0818607262
StatePublished - Dec 1 1986
Externally publishedYes

Publication series

NameDigest of Papers - International Test Conference
ISSN (Print)0743-1686

All Science Journal Classification (ASJC) codes

  • Engineering(all)

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  • Cite this

    Jha, N. K. (1986). DETECTING MULTIPLE FAULTS IN CMOS CIRCUITS. In Digest of Papers - International Test Conference (pp. 514-519). (Digest of Papers - International Test Conference). IEEE.