Abstract
Some efficient systematic codes have recently been developed for detecting t unidirectional errors (Bose-Lin code) and burst unidirectional errors (Bose, Blaum codes). Since unidirectional errors are the most common errors in VLSI circuits, such codes should find widespread use. Totally self-checking (TSC) checker designs have been found for the three codes mentioned above. The designs are easily testable, economical, and have a modular structure. The design for the Bose-Lin code requires at most only 8r-4 codeword tests, where r is the number of checkbits. The number of codeword tests for the TSC checkers for the Bose code and the Blaum code is at most 8r + 4 and 2r + 8r, respectively.
| Original language | English (US) |
|---|---|
| Pages | 32-35 |
| Number of pages | 4 |
| State | Published - 1990 |
| Event | Proceedings of the 32nd Midwest Symposium on Circuits and Systems Part 2 (of 2) - Champaign, IL, USA Duration: Aug 14 1989 → Aug 16 1989 |
Other
| Other | Proceedings of the 32nd Midwest Symposium on Circuits and Systems Part 2 (of 2) |
|---|---|
| City | Champaign, IL, USA |
| Period | 8/14/89 → 8/16/89 |
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Electrical and Electronic Engineering