Design and synthesis of self-checking VLSI circuits and systems

Niraj K. Jha; Sying Jyan Wang

Design and synthesis of self-checking VLSI circuits and systems

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

Self-checking circuits and systems can detect the presence of both transient and permanent faults. The advantage of such a system is that errors can be caught as soon as they occur, thus data contamination is prevented. Although much effort has been concentrated on the design of self-checking checkers by previous researchers, very few results have been presented for the design of self-checking functional circuits, and fewer still for the design of self-checking systems. In this paper, we explore methods for the cost-effective design of combinational and sequential functional circuits, checkers and systems.

Original language	English (US)
Title of host publication	IEEE International Conference on Computer Design - VLSI in Computers and Processors
Publisher	Publ by IEEE
Pages	578-581
Number of pages	4
ISBN (Print)	0818622709
State	Published - 1991
Event	Proceedings of the 1991 IEEE International Conference on Computer Design - VLSI in Computers and Processors - ICCD '91 - Cambridge, MA, USA Duration: Oct 14 1991 → Oct 16 1991

Publication series

Name	IEEE International Conference on Computer Design - VLSI in Computers and Processors

Other

Other	Proceedings of the 1991 IEEE International Conference on Computer Design - VLSI in Computers and Processors - ICCD '91
City	Cambridge, MA, USA
Period	10/14/91 → 10/16/91

All Science Journal Classification (ASJC) codes

Hardware and Architecture
Electrical and Electronic Engineering

Cite this

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title = "Design and synthesis of self-checking VLSI circuits and systems",

abstract = "Self-checking circuits and systems can detect the presence of both transient and permanent faults. The advantage of such a system is that errors can be caught as soon as they occur, thus data contamination is prevented. Although much effort has been concentrated on the design of self-checking checkers by previous researchers, very few results have been presented for the design of self-checking functional circuits, and fewer still for the design of self-checking systems. In this paper, we explore methods for the cost-effective design of combinational and sequential functional circuits, checkers and systems.",

author = "Jha, {Niraj K.} and Wang, {Sying Jyan}",

year = "1991",

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pages = "578--581",

booktitle = "IEEE International Conference on Computer Design - VLSI in Computers and Processors",

note = "Proceedings of the 1991 IEEE International Conference on Computer Design - VLSI in Computers and Processors - ICCD '91 ; Conference date: 14-10-1991 Through 16-10-1991",

}

Jha, NK & Wang, SJ 1991, Design and synthesis of self-checking VLSI circuits and systems. in IEEE International Conference on Computer Design - VLSI in Computers and Processors. IEEE International Conference on Computer Design - VLSI in Computers and Processors, Publ by IEEE, pp. 578-581, Proceedings of the 1991 IEEE International Conference on Computer Design - VLSI in Computers and Processors - ICCD '91, Cambridge, MA, USA, 10/14/91.

Design and synthesis of self-checking VLSI circuits and systems. / Jha, Niraj K.; Wang, Sying Jyan.
IEEE International Conference on Computer Design - VLSI in Computers and Processors. Publ by IEEE, 1991. p. 578-581 (IEEE International Conference on Computer Design - VLSI in Computers and Processors).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

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AU - Jha, Niraj K.

AU - Wang, Sying Jyan

PY - 1991

Y1 - 1991

N2 - Self-checking circuits and systems can detect the presence of both transient and permanent faults. The advantage of such a system is that errors can be caught as soon as they occur, thus data contamination is prevented. Although much effort has been concentrated on the design of self-checking checkers by previous researchers, very few results have been presented for the design of self-checking functional circuits, and fewer still for the design of self-checking systems. In this paper, we explore methods for the cost-effective design of combinational and sequential functional circuits, checkers and systems.

AB - Self-checking circuits and systems can detect the presence of both transient and permanent faults. The advantage of such a system is that errors can be caught as soon as they occur, thus data contamination is prevented. Although much effort has been concentrated on the design of self-checking checkers by previous researchers, very few results have been presented for the design of self-checking functional circuits, and fewer still for the design of self-checking systems. In this paper, we explore methods for the cost-effective design of combinational and sequential functional circuits, checkers and systems.

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M3 - Conference contribution

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T3 - IEEE International Conference on Computer Design - VLSI in Computers and Processors

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BT - IEEE International Conference on Computer Design - VLSI in Computers and Processors

PB - Publ by IEEE

T2 - Proceedings of the 1991 IEEE International Conference on Computer Design - VLSI in Computers and Processors - ICCD '91

Y2 - 14 October 1991 through 16 October 1991

ER -

Design and synthesis of self-checking VLSI circuits and systems

Abstract

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Other

All Science Journal Classification (ASJC) codes

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