Design and synthesis of self-checking VLSI circuits and systems

Niraj Kumar Jha, Sying Jyan Wang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Scopus citations

Abstract

Self-checking circuits and systems can detect the presence of both transient and permanent faults. The advantage of such a system is that errors can be caught as soon as they occur, thus data contamination is prevented. Although much effort has been concentrated on the design of self-checking checkers by previous researchers, very few results have been presented for the design of self-checking functional circuits, and fewer still for the design of self-checking systems. In this paper, we explore methods for the cost-effective design of combinational and sequential functional circuits, checkers and systems.

Original languageEnglish (US)
Title of host publicationIEEE International Conference on Computer Design - VLSI in Computers and Processors
PublisherPubl by IEEE
Pages578-581
Number of pages4
ISBN (Print)0818622709
StatePublished - Dec 1 1991
EventProceedings of the 1991 IEEE International Conference on Computer Design - VLSI in Computers and Processors - ICCD '91 - Cambridge, MA, USA
Duration: Oct 14 1991Oct 16 1991

Other

OtherProceedings of the 1991 IEEE International Conference on Computer Design - VLSI in Computers and Processors - ICCD '91
CityCambridge, MA, USA
Period10/14/9110/16/91

All Science Journal Classification (ASJC) codes

  • Hardware and Architecture
  • Electrical and Electronic Engineering

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  • Cite this

    Jha, N. K., & Wang, S. J. (1991). Design and synthesis of self-checking VLSI circuits and systems. In IEEE International Conference on Computer Design - VLSI in Computers and Processors (pp. 578-581). Publ by IEEE.