Abstract
Self-checking circuits and systems can detect the presence of both transient and permanent faults. The advantage of such a system is that errors can be caught as soon as they occur, thus data contamination is prevented. Although much effort has been concentrated on the design of self-checking checkers by previous researchers, very few results have been presented for the design of self-checking functional circuits, and fewer still for the design of self-checking systems. In this paper, we explore methods for the cost-effective design of combinational and sequential functional circuits, checkers and systems.
| Original language | English (US) |
|---|---|
| Title of host publication | IEEE International Conference on Computer Design - VLSI in Computers and Processors |
| Publisher | Publ by IEEE |
| Pages | 578-581 |
| Number of pages | 4 |
| ISBN (Print) | 0818622709 |
| State | Published - Dec 1 1991 |
| Event | Proceedings of the 1991 IEEE International Conference on Computer Design - VLSI in Computers and Processors - ICCD '91 - Cambridge, MA, USA Duration: Oct 14 1991 → Oct 16 1991 |
Other
| Other | Proceedings of the 1991 IEEE International Conference on Computer Design - VLSI in Computers and Processors - ICCD '91 |
|---|---|
| City | Cambridge, MA, USA |
| Period | 10/14/91 → 10/16/91 |
All Science Journal Classification (ASJC) codes
- Hardware and Architecture
- Electrical and Electronic Engineering