Defect-free band-edge photoluminescence and band gap measurement of pseudomorphic Si1-x-yGexCy alloy layers on Si (100)

A. St. Amour, C. W. Liu, J. C. Sturm, Y. Lacroix, M. L.W. Thewalt

Research output: Contribution to journal › Article › peer-review

109 Scopus citations

Fingerprint

Dive into the research topics of 'Defect-free band-edge photoluminescence and band gap measurement of pseudomorphic Si1-x-yGexCy alloy layers on Si (100)'. Together they form a unique fingerprint.

Keyphrases

Engineering