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Defect-free band-edge photoluminescence and band gap measurement of pseudomorphic Si1-x-yGexCy alloy layers on Si (100)
A. St. Amour, C. W. Liu, J. C. Sturm, Y. Lacroix, M. L.W. Thewalt
Research output: Contribution to journal › Article › peer-review
108
Scopus
citations