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Defect-free band-edge photoluminescence and band gap measurement of pseudomorphic Si1-x-yGexCy alloy layers on Si (100)

  • A. St. Amour
  • , C. W. Liu
  • , J. C. Sturm
  • , Y. Lacroix
  • , M. L.W. Thewalt

Research output: Contribution to journal › Article › peer-review

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