TY - JOUR
T1 - Crystal growth of CsCl-type Yb0.24Sn0.76Ru
AU - Klimczuk, T.
AU - Wang, C. H.
AU - Xu, Q.
AU - Lawrence, J.
AU - Durakiewicz, T.
AU - Ronning, F.
AU - Llobet, A.
AU - Bauer, E. D.
AU - Griveau, J. C.
AU - Sadowski, W.
AU - Zandbergen, H. W.
AU - Thompson, J. D.
AU - Cava, R. J.
N1 - Funding Information:
The authors acknowledge financial support from the European Union under the Framework 6 program under a contract for an Integrated Infrastructure Initiative; reference 026019 ESTEEM . Work at Los Alamos and Princeton was performed under the auspices of the US Department of Energy, Office of Science. We thank Bert Cremer for the use of the SEM microscope.
Copyright:
Copyright 2011 Elsevier B.V., All rights reserved.
PY - 2011/3/1
Y1 - 2011/3/1
N2 - The YbRuSn ternary system was investigated and a new material, Yb 0.24Sn0.76Ru, with a simple cubic crystal structure, was discovered. Yb0.24Sn0.76Ru has a smaller lattice parameter a=3.217(4) Å, than its isostructural YbRu analogue (a=3.360 Å). Both X-ray diffraction and electron microscopy techniques were used to refine the crystal structure of Yb0.24Sn0.76Ru. It was found that a new compound forms in the CsCl structure, with Ru on the 1a site and a (Yb, Sn) mixture on site 1b. The XRD Rietveld analysis provides the occupation of Yb equal to 0.24, in agreement with the single crystal nano-electron diffraction refinement, which gives the occupation 0.21.
AB - The YbRuSn ternary system was investigated and a new material, Yb 0.24Sn0.76Ru, with a simple cubic crystal structure, was discovered. Yb0.24Sn0.76Ru has a smaller lattice parameter a=3.217(4) Å, than its isostructural YbRu analogue (a=3.360 Å). Both X-ray diffraction and electron microscopy techniques were used to refine the crystal structure of Yb0.24Sn0.76Ru. It was found that a new compound forms in the CsCl structure, with Ru on the 1a site and a (Yb, Sn) mixture on site 1b. The XRD Rietveld analysis provides the occupation of Yb equal to 0.24, in agreement with the single crystal nano-electron diffraction refinement, which gives the occupation 0.21.
KW - A1. X-ray diffraction
KW - A2. Single crystal growth
KW - B1. Rare earth compounds
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U2 - 10.1016/j.jcrysgro.2010.10.045
DO - 10.1016/j.jcrysgro.2010.10.045
M3 - Article
AN - SCOPUS:79952740218
SN - 0022-0248
VL - 318
SP - 1005
EP - 1008
JO - Journal of Crystal Growth
JF - Journal of Crystal Growth
IS - 1
ER -