Crystal growth of CsCl-type Yb0.24Sn0.76Ru

T. Klimczuk, C. H. Wang, Q. Xu, J. Lawrence, T. Durakiewicz, F. Ronning, A. Llobet, E. D. Bauer, J. C. Griveau, W. Sadowski, H. W. Zandbergen, J. D. Thompson, R. J. Cava

Research output: Contribution to journalArticlepeer-review

1 Scopus citations

Abstract

The YbRuSn ternary system was investigated and a new material, Yb 0.24Sn0.76Ru, with a simple cubic crystal structure, was discovered. Yb0.24Sn0.76Ru has a smaller lattice parameter a=3.217(4) Å, than its isostructural YbRu analogue (a=3.360 Å). Both X-ray diffraction and electron microscopy techniques were used to refine the crystal structure of Yb0.24Sn0.76Ru. It was found that a new compound forms in the CsCl structure, with Ru on the 1a site and a (Yb, Sn) mixture on site 1b. The XRD Rietveld analysis provides the occupation of Yb equal to 0.24, in agreement with the single crystal nano-electron diffraction refinement, which gives the occupation 0.21.

Original languageEnglish (US)
Pages (from-to)1005-1008
Number of pages4
JournalJournal of Crystal Growth
Volume318
Issue number1
DOIs
StatePublished - Mar 1 2011

All Science Journal Classification (ASJC) codes

  • Condensed Matter Physics
  • Inorganic Chemistry
  • Materials Chemistry

Keywords

  • A1. X-ray diffraction
  • A2. Single crystal growth
  • B1. Rare earth compounds

Fingerprint

Dive into the research topics of 'Crystal growth of CsCl-type Yb0.24Sn0.76Ru'. Together they form a unique fingerprint.

Cite this