Critical properties of the measurement-induced transition in random quantum circuits

Aidan Zabalo, Michael J. Gullans, Justin H. Wilson, Sarang Gopalakrishnan, David A. Huse, J. H. Pixley

Research output: Contribution to journalArticle

7 Scopus citations

Abstract

We numerically study the measurement-driven quantum phase transition of Haar-random quantum circuits in 1+1 dimensions. By analyzing the tripartite mutual information we are able to make a precise estimate of the critical measurement rate pc=0.17(1). We extract estimates for the associated bulk critical exponents that are consistent with the values for percolation, as well as those for stabilizer circuits, but differ from previous estimates for the Haar-random case. Our estimates of the surface order parameter exponent appear different from those for stabilizer circuits or percolation, but we cannot definitively rule out the scenario where all exponents in the three cases match. Moreover, in the Haar case the prefactor for the entanglement entropies Sn depends strongly on the Rényi index n; for stabilizer circuits and percolation this dependence is absent. Results on stabilizer circuits are used to guide our study and identify measures with weak finite-size effects. We discuss how our numerical estimates constrain theories of the transition.

Original languageEnglish (US)
Article number060301
JournalPhysical Review B
Volume101
Issue number6
DOIs
StatePublished - Feb 1 2020

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Fingerprint Dive into the research topics of 'Critical properties of the measurement-induced transition in random quantum circuits'. Together they form a unique fingerprint.

  • Cite this

    Zabalo, A., Gullans, M. J., Wilson, J. H., Gopalakrishnan, S., Huse, D. A., & Pixley, J. H. (2020). Critical properties of the measurement-induced transition in random quantum circuits. Physical Review B, 101(6), [060301]. https://doi.org/10.1103/PhysRevB.101.060301