TY - JOUR

T1 - Critical exponent in the fractional quantum Hall effect

AU - Engel, L.

AU - Wei, H. P.

AU - Tsui, D. C.

AU - Shayegan, M.

N1 - Funding Information:
This work is supported in part by the NSF, grants DMR-8719694 and DMR-8705002, and by the ONR, grant NO00 14-89-J-1567.

PY - 1990/4/2

Y1 - 1990/4/2

N2 - We report the observation of a universal critical exponent in the fractional quantum Hall effect (FQHE) from a study of the temperature (T) dependent electron transport in between Landau level filling factors v = 2 5 and v = 1 3, over a T range from 1.2 K to 22 mK. in an AlGaAs-GaAs heterostructure. Specifically, the maximum value of dpxy dB and the width of pxx show the same power law dependence on T, i.e. ~T-K. The critical exponent K=0.43 ± 0.02.This power law dependence is the same as that obtained in the integral quantum Hall effect (IQHE) [Wei et al., Phys. Rev. Lett. 61 (1988) 1294], in analogy to which our result indicates the existence of a divergent correlation length for the wavefunction of the quasi-particles in the FQHE for 1 3 < v < 2 5. The localization to delocalization transition can be characterized by a universal critical exponent, k, in both the IQHE and the FQHE.

AB - We report the observation of a universal critical exponent in the fractional quantum Hall effect (FQHE) from a study of the temperature (T) dependent electron transport in between Landau level filling factors v = 2 5 and v = 1 3, over a T range from 1.2 K to 22 mK. in an AlGaAs-GaAs heterostructure. Specifically, the maximum value of dpxy dB and the width of pxx show the same power law dependence on T, i.e. ~T-K. The critical exponent K=0.43 ± 0.02.This power law dependence is the same as that obtained in the integral quantum Hall effect (IQHE) [Wei et al., Phys. Rev. Lett. 61 (1988) 1294], in analogy to which our result indicates the existence of a divergent correlation length for the wavefunction of the quasi-particles in the FQHE for 1 3 < v < 2 5. The localization to delocalization transition can be characterized by a universal critical exponent, k, in both the IQHE and the FQHE.

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U2 - 10.1016/0039-6028(90)90820-X

DO - 10.1016/0039-6028(90)90820-X

M3 - Article

AN - SCOPUS:0002893208

SN - 0039-6028

VL - 229

SP - 13

EP - 15

JO - Surface Science

JF - Surface Science

IS - 1-3

ER -