Coverage-based trace signal selection for fault localisation in post-silicon validation

Mathematics

• Silicon 100%
• Fault 82%
• Coverage 70%
• Trace 57%
• Defects 56%
• Buffer 32%
• Integrated Circuits 20%
• Backbone 18%
• Integer Linear Programming 17%
• Prototype 15%
• Observability 15%
• Likely 14%
• Maximise 13%
• Scenarios 12%
• History 12%
• Target 12%
• Evaluate 11%
• Complement 10%
• Strategy 10%
• Cycle 9%
• Simulation 8%
• Design 8%
• Context 8%
• Demonstrate 8%
• Subset 7%

Engineering & Materials Science

• Silicon 55%
• Defects 48%
• Observability 19%
• Linear programming 16%
• Integrated circuits 16%