Coulomb drag experiments in low density 2D hole bilayers

R. Pillarisetty; H. Noh; E. Tutuc; E. P. De Poortere; D. C. Tsui; M. Shayegan

doi:10.1016/j.physe.2006.02.017

Coulomb drag experiments in low density 2D hole bilayers

R. Pillarisetty, H. Noh, E. Tutuc, E. P. De Poortere, D. C. Tsui, M. Shayegan

Research output: Contribution to journal › Article › peer-review

Abstract

We performed experiments studying the Coulomb drag in low density 2D hole bilayers, with r_s ranging from roughly 10 to 20. As the carrier density is lowered into the dilute regime, we observe a significant enhancement of the drag resistivity, such that the interlayer carrier-carrier scattering rate constitutes a major component of the single layer resistivity. In addition, anomalies to the expected temperature and in-plane magnetic field dependences are observed, and are found to correlate with similar anomalies in the single layer resistivity. These results suggests that the origin of the 2D metal-insulator transition phenomena affects both transport properties in a very similar fashion.

Original language	English (US)
Pages (from-to)	63-68
Number of pages	6
Journal	Physica E: Low-Dimensional Systems and Nanostructures
Volume	34
Issue number	1-2
DOIs	https://doi.org/10.1016/j.physe.2006.02.017
State	Published - Aug 2006

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Atomic and Molecular Physics, and Optics
Condensed Matter Physics

Keywords

Double layer systems
Drag
Two-dimensional holes

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10.1016/j.physe.2006.02.017

Cite this

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title = "Coulomb drag experiments in low density 2D hole bilayers",

abstract = "We performed experiments studying the Coulomb drag in low density 2D hole bilayers, with rs ranging from roughly 10 to 20. As the carrier density is lowered into the dilute regime, we observe a significant enhancement of the drag resistivity, such that the interlayer carrier-carrier scattering rate constitutes a major component of the single layer resistivity. In addition, anomalies to the expected temperature and in-plane magnetic field dependences are observed, and are found to correlate with similar anomalies in the single layer resistivity. These results suggests that the origin of the 2D metal-insulator transition phenomena affects both transport properties in a very similar fashion.",

keywords = "Double layer systems, Drag, Two-dimensional holes",

author = "R. Pillarisetty and H. Noh and E. Tutuc and {De Poortere}, {E. P.} and Tsui, {D. C.} and M. Shayegan",

note = "Funding Information: We acknowledge support from the NSF, a DURINT grant from the ONR, and the DOE.",

year = "2006",

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doi = "10.1016/j.physe.2006.02.017",

language = "English (US)",

volume = "34",

pages = "63--68",

journal = "Physica E: Low-Dimensional Systems and Nanostructures",

issn = "1386-9477",

publisher = "Elsevier",

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TY - JOUR

T1 - Coulomb drag experiments in low density 2D hole bilayers

AU - Pillarisetty, R.

AU - Noh, H.

AU - Tutuc, E.

AU - De Poortere, E. P.

AU - Tsui, D. C.

AU - Shayegan, M.

N1 - Funding Information: We acknowledge support from the NSF, a DURINT grant from the ONR, and the DOE.

PY - 2006/8

Y1 - 2006/8

N2 - We performed experiments studying the Coulomb drag in low density 2D hole bilayers, with rs ranging from roughly 10 to 20. As the carrier density is lowered into the dilute regime, we observe a significant enhancement of the drag resistivity, such that the interlayer carrier-carrier scattering rate constitutes a major component of the single layer resistivity. In addition, anomalies to the expected temperature and in-plane magnetic field dependences are observed, and are found to correlate with similar anomalies in the single layer resistivity. These results suggests that the origin of the 2D metal-insulator transition phenomena affects both transport properties in a very similar fashion.

AB - We performed experiments studying the Coulomb drag in low density 2D hole bilayers, with rs ranging from roughly 10 to 20. As the carrier density is lowered into the dilute regime, we observe a significant enhancement of the drag resistivity, such that the interlayer carrier-carrier scattering rate constitutes a major component of the single layer resistivity. In addition, anomalies to the expected temperature and in-plane magnetic field dependences are observed, and are found to correlate with similar anomalies in the single layer resistivity. These results suggests that the origin of the 2D metal-insulator transition phenomena affects both transport properties in a very similar fashion.

KW - Double layer systems

KW - Drag

KW - Two-dimensional holes

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JO - Physica E: Low-Dimensional Systems and Nanostructures

JF - Physica E: Low-Dimensional Systems and Nanostructures

IS - 1-2

ER -

Coulomb drag experiments in low density 2D hole bilayers

Abstract

All Science Journal Classification (ASJC) codes

Keywords

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