Cosmological inference from an emulator based halo model. II. Joint analysis of galaxy-galaxy weak lensing and galaxy clustering from HSC-Y1 and SDSS

We present high-fidelity cosmology results from a blinded joint analysis of galaxy-galaxy weak lensing (Δς) and projected galaxy clustering (wp) measured from the Hyper Suprime-Cam Year-1 (HSC-Y1) data and spectroscopic Sloan Digital Sky Survey (SDSS) galaxy catalogs in the redshift range 0.15<z<0.7. We define luminosity-limited samples of SDSS galaxies to serve as the tracers of wp in three spectroscopic redshift bins, and as the lens samples for Δς. For the Δς measurements, we select a single sample of 4×106 source galaxies over 140 deg2 from HSC-Y1 with photometric redshifts (photo z) greater than 0.75, enabling a better handle of photo-z errors by comparing the Δς amplitudes for the three lens redshift bins. The deep, high-quality HSC-Y1 data enable significant detections of the Δς signals, with integrated signal-to-noise ratio S/N∼15 in the range 3≤R/[h-1 Mpc]≤30 for the three lens samples, despite the small area coverage. For cosmological parameter inference, we use an input galaxy-halo connection model built on the dark emulator package (which uses an ensemble set of high-resolution N-body simulations and enables fast, accurate computation of the clustering observables) with a halo occupation distribution that includes nuisance parameters to marginalize over modeling uncertainties. We model the Δς and wp measurements on scales from R≃3 and 2 h-1 Mpc, respectively, up to 30 h-1 Mpc (therefore excluding the baryon acoustic oscillations information) assuming a flat ΛCDM cosmology, marginalizing over about 20 nuisance parameters and demonstrating the robustness of our results to them. With various tests using mock catalogs described in Miyatake et al. [preceding paper, Phys. Rev. D 106, 083519 (2022)10.1103/PhysRevD.106.083519], we show that any bias in the clustering amplitude S8σ8(ωm/0.3)0.5 due to uncertainties in the galaxy-halo connection is less than ∼50% of the statistical uncertainty of S8, unless the assembly biaseffect is unexpectedly large. Our best-fit models have S8=0.795-0.042+0.049 (mode and 68% credible interval) for the flat ΛCDM model; we find tighter constraints on the quantity S8(α=0.17)σ8(ωm/0.3)0.17=0.745-0.031+0.039.