Correlation of plasma-induced charging voltage measured in-situ by microelectromechanical sensors with device degradation

Kiran Pangal, J. C. Sturm

Research output: Contribution to conferencePaperpeer-review

1 Scopus citations

Fingerprint

Dive into the research topics of 'Correlation of plasma-induced charging voltage measured in-situ by microelectromechanical sensors with device degradation'. Together they form a unique fingerprint.

Engineering

Keyphrases