Comparison study of the influence of taller electron exit barriers on the device performance for ultra-strong coupling quantum cascade laser designs

Peter Q. Liu, Pierre Bouzi, Yamac Dikmelik, Nyan Lynn Aung, Xiaojun Wang, Jen Yu Fan, Claire F. Gmachl

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Two different ultra-strong coupling Quantum Cascade laser designs and their modified versions with two taller electron exit barriers are compared experimentally to study the influence of such taller electron exit barriers on the device performance.

Original languageEnglish (US)
Title of host publicationCLEO
Subtitle of host publicationScience and Innovations, CLEO_SI 2012
PublisherOptical Society of America (OSA)
PagesCF2K.1
ISBN (Print)9781557529435
DOIs
StatePublished - 2012
EventCLEO: Science and Innovations, CLEO_SI 2012 - San Jose, CA, United States
Duration: May 6 2012May 11 2012

Publication series

NameCLEO: Science and Innovations, CLEO_SI 2012

Other

OtherCLEO: Science and Innovations, CLEO_SI 2012
CountryUnited States
CitySan Jose, CA
Period5/6/125/11/12

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials

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    Liu, P. Q., Bouzi, P., Dikmelik, Y., Aung, N. L., Wang, X., Fan, J. Y., & Gmachl, C. F. (2012). Comparison study of the influence of taller electron exit barriers on the device performance for ultra-strong coupling quantum cascade laser designs. In CLEO: Science and Innovations, CLEO_SI 2012 (pp. CF2K.1). (CLEO: Science and Innovations, CLEO_SI 2012). Optical Society of America (OSA). https://doi.org/10.1364/cleo_si.2012.cf2k.1