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Comparison of leed and auger data from cleaved and sputtered-annealed InP(110) surfaces
J. C. Tsang,
A. Kahn
, P. Mark
Electrical and Computer Engineering
Princeton Institute for Computational Science and Engineering
Princeton Institute for the Science and Technology of Materials
School of Engineering & Applied Science
Research output
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Article
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peer-review
37
Scopus citations
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Engineering & Materials Science
Chemical analysis
40%
Model structures
65%
Multiple scattering
95%
Stoichiometry
84%
Chemical Compounds
Reaction Stoichiometry
50%
Surface
100%
Physics & Astronomy
scattering
32%
stoichiometry
60%