Comparison of leed and auger data from cleaved and sputtered-annealed InP(110) surfaces

J. C. Tsang, A. Kahn, P. Mark

Research output: Contribution to journalArticle

36 Scopus citations

Abstract

Comparison is made between Auger and LEED data recorded from cleaved and polished-sputtered-annealed InP(110) surfaces. The qualitative Auger analysis indicates that the sputtered-annealed surface does not quite reach stoichiometry and that LEED measurements are made from a surface presenting an In rich composition. The LEED measurements taken from the two surfaces are compared and found essentially similar, proving that the atomic reconstruction of the ordered portions of the two surfaces are identical. A short description is given of the structure model found by single and multiple scattering computations.

Original languageEnglish (US)
Pages (from-to)119-127
Number of pages9
JournalSurface Science
Volume97
Issue number1
DOIs
StatePublished - Jan 1 1980

All Science Journal Classification (ASJC) codes

  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Materials Chemistry

Fingerprint Dive into the research topics of 'Comparison of leed and auger data from cleaved and sputtered-annealed InP(110) surfaces'. Together they form a unique fingerprint.

  • Cite this