Comparison of ion temperature diagnostics on the Madison symmetric torus reversed-field pinch

J. C. Reardon, D. Craig, D. J. Den Hartog, G. Fiksel, S. C. Prager

Research output: Contribution to journalConference articlepeer-review

Abstract

D, C4+, and C6+ temperatures were measured on Madison symmetric torus using rutherford scattering, charge exchange recombination spectroscopy, and ion dynamics spectrometer diagnostics, respectively. RS measurements consistently agreed with CHERS measurement but it was found to be less than IDS measurement. This was attributed to the effect of C4+ emission profile on the IDS measurements.

Original languageEnglish (US)
Pages (from-to)1892-1895
Number of pages4
JournalReview of Scientific Instruments
Volume74
Issue number3 II
DOIs
StatePublished - Mar 2003
EventProceedings of the 14th Topical Conference on High - Temperature Plasma Diagnostics - Madison, WI, United States
Duration: Jul 8 2002Jul 11 2002

All Science Journal Classification (ASJC) codes

  • Instrumentation

Fingerprint

Dive into the research topics of 'Comparison of ion temperature diagnostics on the Madison symmetric torus reversed-field pinch'. Together they form a unique fingerprint.

Cite this