@inproceedings{03d1b1bfc8a54c39bdfe1e4c46f10d61,
title = "Comparing complex impedance and bias step measurements of Simons Observatory transition edge sensors",
abstract = "The Simons Observatory (SO) will perform ground-based observations of the cosmic microwave background (CMB) with several small and large aperture telescopes, each outfitted with thousands to tens of thousands of superconducting aluminum manganese (AlMn) transition-edge sensor bolometers (TESs). In-situ characterization of TES responsivities and effective time constants will be required multiple times each observing-day for calibrating time-streams during CMB map-making. Effective time constants are typically estimated in the field by briefly applying small amplitude square-waves on top of the TES DC biases, and fitting exponential decays in the bolometer response. These so-called {"}bias step{"}measurements can be rapidly implemented across entire arrays and therefore are attractive because they take up little observing time. However, individual detector complex impedance measurements, while too slow to implement during observations, can provide a fuller picture of the TES model and a better understanding of its temporal response. Here, we present the results of dark TES characterization of many prototype SO bolometers and compare the effective thermal time constants measured via bias steps to those derived from complex impedance data.",
author = "Cothard, {Nicholas F.} and Ali, {Aamir M.} and Austermann, {Jason E.} and Choi, {Steve K.} and Crowley, {Kevin T.} and Dober, {Bradley J.} and Duell, {Cody J.} and Duff, {Shannon M.} and Patricio Gallardo and Hilton, {Gene C.} and Ho, {Shuay Pwu Patty} and Johannes Hubmayr and Link, {Michael J.} and Niemack, {Michael D.} and Sonka, {Rita F.} and Staggs, {Suzanne T.} and Vavagiakis, {Eve M.} and Wollack, {Edward J.} and Zhilei Xu",
note = "Publisher Copyright: {\textcopyright} COPYRIGHT SPIE. Downloading of the abstract is permitted for personal use only.; Millimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy X 2020 ; Conference date: 14-12-2020 Through 22-12-2020",
year = "2020",
doi = "10.1117/12.2575912",
language = "English (US)",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
publisher = "SPIE",
editor = "Jonas Zmuidzinas and Jian-Rong Gao",
booktitle = "Millimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy X",
address = "United States",
}