Comparing complex impedance and bias step measurements of Simons Observatory transition edge sensors

Nicholas F. Cothard, Aamir M. Ali, Jason E. Austermann, Steve K. Choi, Kevin T. Crowley, Bradley J. Dober, Cody J. Duell, Shannon M. Duff, Patricio Gallardo, Gene C. Hilton, Shuay Pwu Patty Ho, Johannes Hubmayr, Michael J. Link, Michael D. Niemack, Rita F. Sonka, Suzanne T. Staggs, Eve M. Vavagiakis, Edward J. Wollack, Zhilei Xu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The Simons Observatory (SO) will perform ground-based observations of the cosmic microwave background (CMB) with several small and large aperture telescopes, each outfitted with thousands to tens of thousands of superconducting aluminum manganese (AlMn) transition-edge sensor bolometers (TESs). In-situ characterization of TES responsivities and effective time constants will be required multiple times each observing-day for calibrating time-streams during CMB map-making. Effective time constants are typically estimated in the field by briefly applying small amplitude square-waves on top of the TES DC biases, and fitting exponential decays in the bolometer response. These so-called "bias step"measurements can be rapidly implemented across entire arrays and therefore are attractive because they take up little observing time. However, individual detector complex impedance measurements, while too slow to implement during observations, can provide a fuller picture of the TES model and a better understanding of its temporal response. Here, we present the results of dark TES characterization of many prototype SO bolometers and compare the effective thermal time constants measured via bias steps to those derived from complex impedance data.

Original languageEnglish (US)
Title of host publicationMillimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy X
EditorsJonas Zmuidzinas, Jian-Rong Gao
PublisherSPIE
ISBN (Electronic)9781510636934
DOIs
StatePublished - 2020
EventMillimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy X 2020 - Virtual, Online, United States
Duration: Dec 14 2020Dec 22 2020

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume11453
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceMillimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy X 2020
Country/TerritoryUnited States
CityVirtual, Online
Period12/14/2012/22/20

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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