Combined photoemission/in vacuo transport study of the indium tin oxide/copper phthalocyanine/N, N′-diphenyl-N,N′-bis(l-naphthyl)-1,1′biphenyl-4, 4″diamine molecular organic semiconductor system

I. G. Hill, Antoine Kahn

Research output: Contribution to journalArticle

144 Scopus citations

Abstract

Ultraviolet photoemission spectroscopy (UPS) was used to study the indium tin oxide/copper phthalocyanine (CuPc) and CuPc/N,N′-diphenyl-N,N′-bis(l-naphthyl)-1,1′biphenyl-1-4, 4″diamine interfaces, which are commonly used as an anode/hole injection layer/hole transport layer combination in organic light emitting devices. In order to assess the validity of the transport barriers measured using UPS, in vacuo I-V measurements have been performed on simple devices grown and measured in the same system as the samples studied using UPS. I-V characteristics were modeled using numerical simulations. The parameters used in the simulated curves which best fit the measured I-V characteristics agree quantitatively with the UPS measured barriers.

Original languageEnglish (US)
Pages (from-to)2116-2122
Number of pages7
JournalJournal of Applied Physics
Volume86
Issue number4
DOIs
StatePublished - Aug 15 1999

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

Fingerprint Dive into the research topics of 'Combined photoemission/in vacuo transport study of the indium tin oxide/copper phthalocyanine/N, N′-diphenyl-N,N′-bis(l-naphthyl)-1,1′biphenyl-4, 4″diamine molecular organic semiconductor system'. Together they form a unique fingerprint.

Cite this