Abstract
Ultraviolet photoemission spectroscopy (UPS) was used to study the indium tin oxide/copper phthalocyanine (CuPc) and CuPc/N,N′-diphenyl-N,N′-bis(l-naphthyl)-1,1′biphenyl-1-4, 4″diamine interfaces, which are commonly used as an anode/hole injection layer/hole transport layer combination in organic light emitting devices. In order to assess the validity of the transport barriers measured using UPS, in vacuo I-V measurements have been performed on simple devices grown and measured in the same system as the samples studied using UPS. I-V characteristics were modeled using numerical simulations. The parameters used in the simulated curves which best fit the measured I-V characteristics agree quantitatively with the UPS measured barriers.
Original language | English (US) |
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Pages (from-to) | 2116-2122 |
Number of pages | 7 |
Journal | Journal of Applied Physics |
Volume | 86 |
Issue number | 4 |
DOIs | |
State | Published - Aug 15 1999 |
All Science Journal Classification (ASJC) codes
- General Physics and Astronomy