Cleaved-edge overgrowth of aligned quantum dots on strained layers of InGaAs

D. Wasserman, S. A. Lyon

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7 Scopus citations


Strain aligned InAs quantum dots were grown on the cleaved edges of first growth samples containing strained In xGa (1-x)As layers of varying thickness and indium fraction. The formation of the cleaved-edge quantum dots was observed by means of atomic force microscopy. 100% linear alignment of InAs quantum dots over the InGaAs strain layers of the first growth sample is demonstrated. Linear density of the aligned dots was found to depend on the properties of the underlying InGaAs strain layers. Vertical alignment of an additional InAs quantum dot layer over the buried, linearly aligned, initial dot layer was observed for thin GaAs spacer layers.

Original languageEnglish (US)
Article number3
Pages (from-to)5352-5354
Number of pages3
JournalApplied Physics Letters
Issue number22
StatePublished - Nov 29 2004

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)


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