Charge-Induced Structural Rearrangements in Organic Mixed Ionic Electronic Conductors: A Cryogenic 4D-STEM Study

Yael Tsarfati; Karen C. Bustillo; Benjamin H. Savitzky; Adam Marks; Iain McCulloch; Colin Ophus; Andrew M. Minor; Alberto Salleo

doi:10.1093/mam/ozae044.979

Charge-Induced Structural Rearrangements in Organic Mixed Ionic Electronic Conductors: A Cryogenic 4D-STEM Study

Yael Tsarfati
, Karen C. Bustillo
, Benjamin H. Savitzky
, Adam Marks
, Iain McCulloch
, Colin Ophus
, Andrew M. Minor
, Alberto Salleo

Research output: Contribution to journal › Conference article › peer-review

Original language	English (US)
Pages (from-to)	1980
Number of pages	1
Journal	Microscopy and Microanalysis
Volume	30
Issue number	2024
DOIs	https://doi.org/10.1093/mam/ozae044.979
State	Published - Jul 24 2024
Externally published	Yes
Event	82nd Annual Meeting Microscopy Society of America and the 58th Annual Meeting Microanalysis Society, M and M 2024 - Cleveland, United States Duration: Jul 28 2024 → Aug 1 2024

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Instrumentation

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10.1093/mam/ozae044.979

Cite this

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title = "Charge-Induced Structural Rearrangements in Organic Mixed Ionic Electronic Conductors: A Cryogenic 4D-STEM Study",

author = "Yael Tsarfati and Bustillo, \{Karen C.\} and Savitzky, \{Benjamin H.\} and Adam Marks and Iain McCulloch and Colin Ophus and Minor, \{Andrew M.\} and Alberto Salleo",

year = "2024",

month = jul,

day = "24",

doi = "10.1093/mam/ozae044.979",

language = "English (US)",

volume = "30",

pages = "1980",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Oxford University Press",

number = "2024",

note = "82nd Annual Meeting Microscopy Society of America and the 58th Annual Meeting Microanalysis Society, M and M 2024 ; Conference date: 28-07-2024 Through 01-08-2024",

}

TY - JOUR

T1 - Charge-Induced Structural Rearrangements in Organic Mixed Ionic Electronic Conductors

T2 - 82nd Annual Meeting Microscopy Society of America and the 58th Annual Meeting Microanalysis Society, M and M 2024

AU - Tsarfati, Yael

AU - Bustillo, Karen C.

AU - Savitzky, Benjamin H.

AU - Marks, Adam

AU - McCulloch, Iain

AU - Ophus, Colin

AU - Minor, Andrew M.

AU - Salleo, Alberto

PY - 2024/7/24

Y1 - 2024/7/24

UR - https://www.scopus.com/pages/publications/85215695283

UR - https://www.scopus.com/pages/publications/85215695283#tab=citedBy

U2 - 10.1093/mam/ozae044.979

DO - 10.1093/mam/ozae044.979

M3 - Conference article

AN - SCOPUS:85215695283

SN - 1431-9276

VL - 30

SP - 1980

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - 2024

Y2 - 28 July 2024 through 1 August 2024

ER -

Charge-Induced Structural Rearrangements in Organic Mixed Ionic Electronic Conductors: A Cryogenic 4D-STEM Study

All Science Journal Classification (ASJC) codes

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