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Charge-density-wave conduction noise: Frequency locking in short samples
X. J. Zhang,
N. P. Ong
Research output
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Contribution to journal
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Article
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peer-review
19
Scopus citations
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Dive into the research topics of 'Charge-density-wave conduction noise: Frequency locking in short samples'. Together they form a unique fingerprint.
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Engineering
Charge Density
100%
Frequency Noise
100%
Slip Model
50%
Thermal Gradient
50%
Keyphrases
Short Samples
100%
Noise Frequency
100%
Phase Slips
50%