Characterization of C 70 doped poly(styrene) -b- Poly(hexyl methacrylate) (PS-PHMA) thin film on c-Si substrate with a Jobin Yvon UVISEL, phase modulated spectroscopic ellipsometer (PMSE)

Alan R. Kramer, Nan Yao, Vincent Pelletier

Research output: Contribution to journal › Conference article › peer-review

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Material Science

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