Characterization of C 70 doped poly(styrene) -b- Poly(hexyl methacrylate) (PS-PHMA) thin film on c-Si substrate with a Jobin Yvon UVISEL, phase modulated spectroscopic ellipsometer (PMSE)
- Alan R. Kramer
- , Nan Yao
- , Vincent Pelletier
Research output: Contribution to journal › Conference article › peer-review