Characterization of C 70 doped poly(styrene) -b- Poly(hexyl methacrylate) (PS-PHMA) thin film on c-Si substrate with a Jobin Yvon UVISEL, phase modulated spectroscopic ellipsometer (PMSE)

Alan R. Kramer, Nan Yao, Vincent Pelletier

Research output: Contribution to journalConference article

Abstract

Spectroscopic ellipsometry 1 is commonly used for the optical characterization of solid state thin films and bulk substrates. In recent years, it has also gained widespread use in characterizing organic films 2. The discovery of carbon nano-tubes has increased the utility of organic films by allowing the engineer to alter the electrical and mechanical properties of the material by doping the film with these graphite structures. Proper understanding through PMSE characterization of the structure is necessary to control desired optical and electrical properties. In this work we present mothodes of PMSE as an advantageous, non-destructive optical tool for the study of C 70 doped PS-PHMA thin film on a c-Si(100) wafer. For the samples measured, concentration of C 70 is reported along with dispersion relations for PS-PHMA films in the UV-Vis spectrum for untreated, heated and shear aligned films. There is also evidence that the C 70 may also align within the micro-domain of the PS-PHMA producing an anisotropic film.

Original languageEnglish (US)
Article number15
Pages (from-to)116-123
Number of pages8
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume5527
DOIs
StatePublished - 2004
EventAdvances in Thin Film Coatings for Optical Applications - Denver, CO, United States
Duration: Aug 4 2004Aug 5 2004

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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