Abstract
Layers of GaAs and Ca0.5Sr0.5F2 are grown by molecular beam epitaxy. The morphology, orientation, composition and crystallinity of the layers are analyzed as a function of growth temperature and surface treatment. The fluoride layers show a high degree of crystallinity and a smooth surface morphology. The crystallinity and morphology of the GaAs overlayer are improved by electron irradiation of the fluoride surface prior to GaAs growth followed by a two-step growth procedure for the GaAs overlayer. A technique of electron-beam patterning of the fluoride layer is developed and the formation of 3-5 μm features is demonstrated.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 855-860 |
| Number of pages | 6 |
| Journal | Applied Surface Science |
| Volume | 56-58 |
| Issue number | PART 2 |
| DOIs | |
| State | Published - 1992 |
All Science Journal Classification (ASJC) codes
- Condensed Matter Physics
- Surfaces, Coatings and Films
- Surfaces and Interfaces