The optical absorption of a-Si:H,F a-Si0.4,Ge0.6:H,F superlattices have been measured over a range of well sublayer widths. The absorption data have been analyzed to yield a defect density per superlattice interface of ≈1010 cm-2. Electron and hole drift mobilities data suggest a transition from scattering dominated transport in states at the top of the barriers for short superlattice periods, to recombination dominated transport at the bottom of the wells for large periods. The data are used to estimate a characteristics scattering length of ≈3 nm in bulk a-Si0.4Ge0.6:H,F.
All Science Journal Classification (ASJC) codes
- Materials Science(all)
- Condensed Matter Physics
- Electrical and Electronic Engineering