TY - JOUR
T1 - Calculation of the Johann error for spherically bent x-ray imaging crystal spectrometers
AU - Wang, E.
AU - Beiersdorfer, P.
AU - Gu, M.
AU - Bitter, M.
AU - Delgado-Aparicio, L.
AU - Hill, K. W.
AU - Reinke, M.
AU - Rice, J. E.
AU - Podpaly, Y.
PY - 2010/10
Y1 - 2010/10
N2 - New x-ray imaging crystal spectrometers, currently operating on Alcator C-Mod, NSTX, EAST, and KSTAR, record spectral lines of highly charged ions, such as Ar16+, from multiple sightlines to obtain profiles of ion temperature and of toroidal plasma rotation velocity from Doppler measurements. In the present work, we describe a new data analysis routine, which accounts for the specific geometry of the sightlines of a curved-crystal spectrometer and includes corrections for the Johann error to facilitate the tomographic inversion. Such corrections are important to distinguish velocity induced Doppler shifts from instrumental line shifts caused by the Johann error. The importance of this correction is demonstrated using data from Alcator C-Mod.
AB - New x-ray imaging crystal spectrometers, currently operating on Alcator C-Mod, NSTX, EAST, and KSTAR, record spectral lines of highly charged ions, such as Ar16+, from multiple sightlines to obtain profiles of ion temperature and of toroidal plasma rotation velocity from Doppler measurements. In the present work, we describe a new data analysis routine, which accounts for the specific geometry of the sightlines of a curved-crystal spectrometer and includes corrections for the Johann error to facilitate the tomographic inversion. Such corrections are important to distinguish velocity induced Doppler shifts from instrumental line shifts caused by the Johann error. The importance of this correction is demonstrated using data from Alcator C-Mod.
UR - https://www.scopus.com/pages/publications/78149438732
UR - https://www.scopus.com/inward/citedby.url?scp=78149438732&partnerID=8YFLogxK
U2 - 10.1063/1.3491195
DO - 10.1063/1.3491195
M3 - Article
C2 - 21034027
AN - SCOPUS:78149438732
SN - 0034-6748
VL - 81
JO - Review of Scientific Instruments
JF - Review of Scientific Instruments
IS - 10
M1 - 10E329
ER -