Boron diffusion and silicon self-interstitial recycling between SiGeC layers

M. S. Carroll, J. C. Sturm

Research output: Contribution to journalConference articlepeer-review

Fingerprint

Dive into the research topics of 'Boron diffusion and silicon self-interstitial recycling between SiGeC layers'. Together they form a unique fingerprint.

Engineering

Keyphrases