Bonding Self-Assembled, Compact Organophosphonate Monolayers to the Native Oxide Surface of Silicon

Eric L. Hanson, Jeffrey Schwartz, Bert Nickel, Norbert Koch, Mehmet Fatih Danisman

Research output: Contribution to journalArticle

265 Scopus citations

Abstract

A new method is described to prepare strongly bonded, compact monolayer films of alkyl- or arylphosphonates on the native oxide surface of Si (SiO 2/Si). This method is illustrated for octadecyl- and α-quarterthiophene-2-phosphonates. For both cases, AFM shows comprehensive coverage of the SiO2/Si surface. The thickness of the continuous film of 4TP/SiO2/Si was measured both by AFM and by X-ray reflectivity to be ca. 18 Å. Direct gravimetric analysis shows surface coverage by α-quarterthiophene-2-phosphonate to be about 0.66 nmol/cm 2, which corresponds to molecular packing in the film close to that of crystalline α-quarterthiophene. Coverage by octadecylphosphonate was ca. 0.90 nmol/cm2, corresponding to a cross-sectional area of about 18.5 Å2/molecule, consistent with close-packed alkyl chains.

Original languageEnglish (US)
Pages (from-to)16074-16080
Number of pages7
JournalJournal of the American Chemical Society
Volume125
Issue number51
DOIs
StatePublished - Dec 24 2003

All Science Journal Classification (ASJC) codes

  • Catalysis
  • Chemistry(all)
  • Biochemistry
  • Colloid and Surface Chemistry

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