Bonding Self-Assembled, Compact Organophosphonate Monolayers to the Native Oxide Surface of Silicon

Eric L. Hanson; Jeffrey Schwartz; Bert Nickel; Norbert Koch; Mehmet Fatih Danisman

doi:10.1021/ja035956z

Bonding Self-Assembled, Compact Organophosphonate Monolayers to the Native Oxide Surface of Silicon

Eric L. Hanson, Jeffrey Schwartz, Bert Nickel, Norbert Koch, Mehmet Fatih Danisman

Research output: Contribution to journal › Article › peer-review

307 Scopus citations

Abstract

A new method is described to prepare strongly bonded, compact monolayer films of alkyl- or arylphosphonates on the native oxide surface of Si (SiO ₂/Si). This method is illustrated for octadecyl- and α-quarterthiophene-2-phosphonates. For both cases, AFM shows comprehensive coverage of the SiO₂/Si surface. The thickness of the continuous film of 4TP/SiO₂/Si was measured both by AFM and by X-ray reflectivity to be ca. 18 Å. Direct gravimetric analysis shows surface coverage by α-quarterthiophene-2-phosphonate to be about 0.66 nmol/cm ², which corresponds to molecular packing in the film close to that of crystalline α-quarterthiophene. Coverage by octadecylphosphonate was ca. 0.90 nmol/cm², corresponding to a cross-sectional area of about 18.5 Å²/molecule, consistent with close-packed alkyl chains.

Original language	English (US)
Pages (from-to)	16074-16080
Number of pages	7
Journal	Journal of the American Chemical Society
Volume	125
Issue number	51
DOIs	https://doi.org/10.1021/ja035956z
State	Published - Dec 24 2003

All Science Journal Classification (ASJC) codes

General Chemistry
Biochemistry
Catalysis
Colloid and Surface Chemistry

Access to Document

10.1021/ja035956z

Cite this

@article{8b804ae095414a28a618337301719f4d,

title = "Bonding Self-Assembled, Compact Organophosphonate Monolayers to the Native Oxide Surface of Silicon",

abstract = "A new method is described to prepare strongly bonded, compact monolayer films of alkyl- or arylphosphonates on the native oxide surface of Si (SiO 2/Si). This method is illustrated for octadecyl- and α-quarterthiophene-2-phosphonates. For both cases, AFM shows comprehensive coverage of the SiO2/Si surface. The thickness of the continuous film of 4TP/SiO2/Si was measured both by AFM and by X-ray reflectivity to be ca. 18 {\AA}. Direct gravimetric analysis shows surface coverage by α-quarterthiophene-2-phosphonate to be about 0.66 nmol/cm 2, which corresponds to molecular packing in the film close to that of crystalline α-quarterthiophene. Coverage by octadecylphosphonate was ca. 0.90 nmol/cm2, corresponding to a cross-sectional area of about 18.5 {\AA}2/molecule, consistent with close-packed alkyl chains.",

author = "Hanson, {Eric L.} and Jeffrey Schwartz and Bert Nickel and Norbert Koch and Danisman, {Mehmet Fatih}",

year = "2003",

month = dec,

day = "24",

doi = "10.1021/ja035956z",

language = "English (US)",

volume = "125",

pages = "16074--16080",

journal = "Journal of the American Chemical Society",

issn = "0002-7863",

publisher = "American Chemical Society",

number = "51",

}

TY - JOUR

T1 - Bonding Self-Assembled, Compact Organophosphonate Monolayers to the Native Oxide Surface of Silicon

AU - Hanson, Eric L.

AU - Schwartz, Jeffrey

AU - Nickel, Bert

AU - Koch, Norbert

AU - Danisman, Mehmet Fatih

PY - 2003/12/24

Y1 - 2003/12/24

N2 - A new method is described to prepare strongly bonded, compact monolayer films of alkyl- or arylphosphonates on the native oxide surface of Si (SiO 2/Si). This method is illustrated for octadecyl- and α-quarterthiophene-2-phosphonates. For both cases, AFM shows comprehensive coverage of the SiO2/Si surface. The thickness of the continuous film of 4TP/SiO2/Si was measured both by AFM and by X-ray reflectivity to be ca. 18 Å. Direct gravimetric analysis shows surface coverage by α-quarterthiophene-2-phosphonate to be about 0.66 nmol/cm 2, which corresponds to molecular packing in the film close to that of crystalline α-quarterthiophene. Coverage by octadecylphosphonate was ca. 0.90 nmol/cm2, corresponding to a cross-sectional area of about 18.5 Å2/molecule, consistent with close-packed alkyl chains.

AB - A new method is described to prepare strongly bonded, compact monolayer films of alkyl- or arylphosphonates on the native oxide surface of Si (SiO 2/Si). This method is illustrated for octadecyl- and α-quarterthiophene-2-phosphonates. For both cases, AFM shows comprehensive coverage of the SiO2/Si surface. The thickness of the continuous film of 4TP/SiO2/Si was measured both by AFM and by X-ray reflectivity to be ca. 18 Å. Direct gravimetric analysis shows surface coverage by α-quarterthiophene-2-phosphonate to be about 0.66 nmol/cm 2, which corresponds to molecular packing in the film close to that of crystalline α-quarterthiophene. Coverage by octadecylphosphonate was ca. 0.90 nmol/cm2, corresponding to a cross-sectional area of about 18.5 Å2/molecule, consistent with close-packed alkyl chains.

UR - http://www.scopus.com/inward/record.url?scp=0345733895&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0345733895&partnerID=8YFLogxK

U2 - 10.1021/ja035956z

DO - 10.1021/ja035956z

M3 - Article

C2 - 14677999

AN - SCOPUS:0345733895

SN - 0002-7863

VL - 125

SP - 16074

EP - 16080

JO - Journal of the American Chemical Society

JF - Journal of the American Chemical Society

IS - 51

ER -

Bonding Self-Assembled, Compact Organophosphonate Monolayers to the Native Oxide Surface of Silicon

Abstract

All Science Journal Classification (ASJC) codes

Access to Document

Other files and links

Fingerprint

Cite this