TY - GEN
T1 - Blurred Image Region Detection based on Stacked Auto-Encoder
AU - Zhou, Yuan
AU - Yang, Jianxing
AU - Chen, Yang
AU - Kung, Sun Yuan
N1 - Publisher Copyright:
© 2018 IEEE.
PY - 2018/11/26
Y1 - 2018/11/26
N2 - In this study, we address a fundamental yet challenging problem on detection and classification of blurred regions in partially blurred images. We propose to learn a latent feature representation with stacked auto-encoder (SAE) network to perform blur region detection. Most previous approaches focus on extracting a few blur features in image gradient, Fourier domain, and data-driven local filters. We extract a latent high-level feature representation from such low-level features using the stacked auto-encoder network, thereby improve the accuracy of blur region classification. This high accuracy enables us to successfully separate the clear and blurred regions. Experimental results demonstrate that the proposed method significantly outperforms the state-of-the-arts methods in detecting and classifying blur regions in partially blurred images.
AB - In this study, we address a fundamental yet challenging problem on detection and classification of blurred regions in partially blurred images. We propose to learn a latent feature representation with stacked auto-encoder (SAE) network to perform blur region detection. Most previous approaches focus on extracting a few blur features in image gradient, Fourier domain, and data-driven local filters. We extract a latent high-level feature representation from such low-level features using the stacked auto-encoder network, thereby improve the accuracy of blur region classification. This high accuracy enables us to successfully separate the clear and blurred regions. Experimental results demonstrate that the proposed method significantly outperforms the state-of-the-arts methods in detecting and classifying blur regions in partially blurred images.
UR - http://www.scopus.com/inward/record.url?scp=85059740482&partnerID=8YFLogxK
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U2 - 10.1109/ICPR.2018.8545567
DO - 10.1109/ICPR.2018.8545567
M3 - Conference contribution
AN - SCOPUS:85059740482
T3 - Proceedings - International Conference on Pattern Recognition
SP - 2959
EP - 2964
BT - 2018 24th International Conference on Pattern Recognition, ICPR 2018
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 24th International Conference on Pattern Recognition, ICPR 2018
Y2 - 20 August 2018 through 24 August 2018
ER -