Belle silicon vertex detector for the Super B Factory

M. Friedl; H. Aihara; T. Arakawa; Y. Asano; T. Aso; A. Bakich; M. Barbero; T. Browder; M. C. Chang; Y. Chao; K. F. Chen; S. Chidzik; A. Chouvikov; Y. K. Choi; J. Dalseno; S. Fratina; Y. Fujiyama; J. Haba; K. Hara; T. Hara; B. Harrop; K. Hayashi; M. Hazumi; D. Heffernan; T. Higuchi; T. Hirakawa; C. Irmler; H. Ishino; S. Kajiwara; H. Kakuno; T. Kameshima; T. Kawasaki; A. Kibayashi; Y. J. Kim; S. Koike; S. Korpar; P. Križan; H. Kurashiro; A. Kusaka; D. Marlow; H. Matsumoto; H. Miyake; G. R. Moloney; Y. Nakahama; Z. Natkaniec; S. Okuno; S. Ono; Y. Onuki; W. Ostrowicz; H. Ozaki; L. Peak; M. Pernicka; M. Rosen; M. Rozanska; N. Sato; S. Schmid; J. Schümann; S. Stanič; H. Steininger; K. Sumisawa; O. Tajima; K. Takahashi; N. Tamura; M. Tanaka; N. Tani; G. N. Taylor; K. Trabelsi; T. Tsuboyama; K. Uchida; K. Ueno; Y. Ushiroda; G. Varner; K. Varvell; Y. S. Velikzhanin; C. C. Wang; M. Z. Wang; M. Watanabe; Y. Watanabe; H. Yamamoto; Y. Yamashita; T. Ziegler

doi:10.1016/j.nima.2006.09.054

Belle silicon vertex detector for the Super B Factory

M. Friedl, H. Aihara, T. Arakawa, Y. Asano, T. Aso, A. Bakich, M. Barbero, T. Browder, M. C. Chang, Y. Chao, K. F. Chen, S. Chidzik, A. Chouvikov, Y. K. Choi, J. Dalseno, S. Fratina, Y. Fujiyama, J. Haba, K. Hara, T. HaraB. Harrop, K. Hayashi, M. Hazumi, D. Heffernan, T. Higuchi, T. Hirakawa, C. Irmler, H. Ishino, S. Kajiwara, H. Kakuno, T. Kameshima, T. Kawasaki, A. Kibayashi, Y. J. Kim, S. Koike, S. Korpar, P. Križan, H. Kurashiro, A. Kusaka, D. Marlow, H. Matsumoto, H. Miyake, G. R. Moloney, Y. Nakahama, Z. Natkaniec, S. Okuno, S. Ono, Y. Onuki, W. Ostrowicz, H. Ozaki, L. Peak, M. Pernicka, M. Rosen, M. Rozanska, N. Sato, S. Schmid, J. Schümann, S. Stanič, H. Steininger, K. Sumisawa, O. Tajima, K. Takahashi, N. Tamura, M. Tanaka, N. Tani, G. N. Taylor, K. Trabelsi, T. Tsuboyama, K. Uchida, K. Ueno, Y. Ushiroda, G. Varner, K. Varvell, Y. S. Velikzhanin, C. C. Wang, M. Z. Wang, M. Watanabe, Y. Watanabe, H. Yamamoto, Y. Yamashita, T. Ziegler

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Abstract

The silicon vertex detector (SVD2) of the Belle experiment at KEK (Tsukuba, Japan) is currently close to its limits in terms of the occupancy of the innermost layer and the readout dead time. In order to cope with further increase in luminosity, different levels of upgrades are proposed: small improvements are possible in the short term by tuning the current system at the cost of signal-to-noise and crosstalk. In 2007, the two inner layers of the SVD2 will be replaced by similar detectors with faster readout electronics (SVD2.5) and in the long term, a major upgrade of the full silicon vertex detector (SVD3) is envisaged for the KEK Super B Factory. These upgrade scenarios will be discussed in detail from the hardware point of view along with the options under study.

Original language	English (US)
Pages (from-to)	37-40
Number of pages	4
Journal	Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Volume	569
Issue number	1
DOIs	https://doi.org/10.1016/j.nima.2006.09.054
State	Published - Dec 10 2006

All Science Journal Classification (ASJC) codes

Nuclear and High Energy Physics
Instrumentation

Keywords

Belle
Silicon vertex detector
Upgrade

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10.1016/j.nima.2006.09.054

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Friedl, M., Aihara, H., Arakawa, T., Asano, Y., Aso, T., Bakich, A., Barbero, M., Browder, T., Chang, M. C., Chao, Y., Chen, K. F., Chidzik, S., Chouvikov, A., Choi, Y. K., Dalseno, J., Fratina, S., Fujiyama, Y., Haba, J., Hara, K., ... Ziegler, T. (2006). Belle silicon vertex detector for the Super B Factory. Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 569(1), 37-40. https://doi.org/10.1016/j.nima.2006.09.054

@article{e3bd08d9c8f64623825998867f595061,

title = "Belle silicon vertex detector for the Super B Factory",

abstract = "The silicon vertex detector (SVD2) of the Belle experiment at KEK (Tsukuba, Japan) is currently close to its limits in terms of the occupancy of the innermost layer and the readout dead time. In order to cope with further increase in luminosity, different levels of upgrades are proposed: small improvements are possible in the short term by tuning the current system at the cost of signal-to-noise and crosstalk. In 2007, the two inner layers of the SVD2 will be replaced by similar detectors with faster readout electronics (SVD2.5) and in the long term, a major upgrade of the full silicon vertex detector (SVD3) is envisaged for the KEK Super B Factory. These upgrade scenarios will be discussed in detail from the hardware point of view along with the options under study.",

keywords = "Belle, Silicon vertex detector, Upgrade",

author = "M. Friedl and H. Aihara and T. Arakawa and Y. Asano and T. Aso and A. Bakich and M. Barbero and T. Browder and Chang, {M. C.} and Y. Chao and Chen, {K. F.} and S. Chidzik and A. Chouvikov and Choi, {Y. K.} and J. Dalseno and S. Fratina and Y. Fujiyama and J. Haba and K. Hara and T. Hara and B. Harrop and K. Hayashi and M. Hazumi and D. Heffernan and T. Higuchi and T. Hirakawa and C. Irmler and H. Ishino and S. Kajiwara and H. Kakuno and T. Kameshima and T. Kawasaki and A. Kibayashi and Kim, {Y. J.} and S. Koike and S. Korpar and P. Kri{\v z}an and H. Kurashiro and A. Kusaka and D. Marlow and H. Matsumoto and H. Miyake and Moloney, {G. R.} and Y. Nakahama and Z. Natkaniec and S. Okuno and S. Ono and Y. Onuki and W. Ostrowicz and H. Ozaki and L. Peak and M. Pernicka and M. Rosen and M. Rozanska and N. Sato and S. Schmid and J. Sch{\"u}mann and S. Stani{\v c} and H. Steininger and K. Sumisawa and O. Tajima and K. Takahashi and N. Tamura and M. Tanaka and N. Tani and Taylor, {G. N.} and K. Trabelsi and T. Tsuboyama and K. Uchida and K. Ueno and Y. Ushiroda and G. Varner and K. Varvell and Velikzhanin, {Y. S.} and Wang, {C. C.} and Wang, {M. Z.} and M. Watanabe and Y. Watanabe and H. Yamamoto and Y. Yamashita and T. Ziegler",

year = "2006",

month = dec,

day = "10",

doi = "10.1016/j.nima.2006.09.054",

language = "English (US)",

volume = "569",

pages = "37--40",

journal = "Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment",

issn = "0168-9002",

publisher = "Elsevier",

number = "1",

}

Friedl, M, Aihara, H, Arakawa, T, Asano, Y, Aso, T, Bakich, A, Barbero, M, Browder, T, Chang, MC, Chao, Y, Chen, KF, Chidzik, S, Chouvikov, A, Choi, YK, Dalseno, J, Fratina, S, Fujiyama, Y, Haba, J, Hara, K, Hara, T, Harrop, B, Hayashi, K, Hazumi, M, Heffernan, D, Higuchi, T, Hirakawa, T, Irmler, C, Ishino, H, Kajiwara, S, Kakuno, H, Kameshima, T, Kawasaki, T, Kibayashi, A, Kim, YJ, Koike, S, Korpar, S, Križan, P, Kurashiro, H, Kusaka, A, Marlow, D, Matsumoto, H, Miyake, H, Moloney, GR, Nakahama, Y, Natkaniec, Z, Okuno, S, Ono, S, Onuki, Y, Ostrowicz, W, Ozaki, H, Peak, L, Pernicka, M, Rosen, M, Rozanska, M, Sato, N, Schmid, S, Schümann, J, Stanič, S, Steininger, H, Sumisawa, K, Tajima, O, Takahashi, K, Tamura, N, Tanaka, M, Tani, N, Taylor, GN, Trabelsi, K, Tsuboyama, T, Uchida, K, Ueno, K, Ushiroda, Y, Varner, G, Varvell, K, Velikzhanin, YS, Wang, CC, Wang, MZ, Watanabe, M, Watanabe, Y, Yamamoto, H, Yamashita, Y & Ziegler, T 2006, 'Belle silicon vertex detector for the Super B Factory', Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, vol. 569, no. 1, pp. 37-40. https://doi.org/10.1016/j.nima.2006.09.054

TY - JOUR

T1 - Belle silicon vertex detector for the Super B Factory

AU - Friedl, M.

AU - Aihara, H.

AU - Arakawa, T.

AU - Asano, Y.

AU - Aso, T.

AU - Bakich, A.

AU - Barbero, M.

AU - Browder, T.

AU - Chang, M. C.

AU - Chao, Y.

AU - Chen, K. F.

AU - Chidzik, S.

AU - Chouvikov, A.

AU - Choi, Y. K.

AU - Dalseno, J.

AU - Fratina, S.

AU - Fujiyama, Y.

AU - Haba, J.

AU - Hara, K.

AU - Hara, T.

AU - Harrop, B.

AU - Hayashi, K.

AU - Hazumi, M.

AU - Heffernan, D.

AU - Higuchi, T.

AU - Hirakawa, T.

AU - Irmler, C.

AU - Ishino, H.

AU - Kajiwara, S.

AU - Kakuno, H.

AU - Kameshima, T.

AU - Kawasaki, T.

AU - Kibayashi, A.

AU - Kim, Y. J.

AU - Koike, S.

AU - Korpar, S.

AU - Križan, P.

AU - Kurashiro, H.

AU - Kusaka, A.

AU - Marlow, D.

AU - Matsumoto, H.

AU - Miyake, H.

AU - Moloney, G. R.

AU - Nakahama, Y.

AU - Natkaniec, Z.

AU - Okuno, S.

AU - Ono, S.

AU - Onuki, Y.

AU - Ostrowicz, W.

AU - Ozaki, H.

AU - Peak, L.

AU - Pernicka, M.

AU - Rosen, M.

AU - Rozanska, M.

AU - Sato, N.

AU - Schmid, S.

AU - Schümann, J.

AU - Stanič, S.

AU - Steininger, H.

AU - Sumisawa, K.

AU - Tajima, O.

AU - Takahashi, K.

AU - Tamura, N.

AU - Tanaka, M.

AU - Tani, N.

AU - Taylor, G. N.

AU - Trabelsi, K.

AU - Tsuboyama, T.

AU - Uchida, K.

AU - Ueno, K.

AU - Ushiroda, Y.

AU - Varner, G.

AU - Varvell, K.

AU - Velikzhanin, Y. S.

AU - Wang, C. C.

AU - Wang, M. Z.

AU - Watanabe, M.

AU - Watanabe, Y.

AU - Yamamoto, H.

AU - Yamashita, Y.

AU - Ziegler, T.

PY - 2006/12/10

Y1 - 2006/12/10

N2 - The silicon vertex detector (SVD2) of the Belle experiment at KEK (Tsukuba, Japan) is currently close to its limits in terms of the occupancy of the innermost layer and the readout dead time. In order to cope with further increase in luminosity, different levels of upgrades are proposed: small improvements are possible in the short term by tuning the current system at the cost of signal-to-noise and crosstalk. In 2007, the two inner layers of the SVD2 will be replaced by similar detectors with faster readout electronics (SVD2.5) and in the long term, a major upgrade of the full silicon vertex detector (SVD3) is envisaged for the KEK Super B Factory. These upgrade scenarios will be discussed in detail from the hardware point of view along with the options under study.

AB - The silicon vertex detector (SVD2) of the Belle experiment at KEK (Tsukuba, Japan) is currently close to its limits in terms of the occupancy of the innermost layer and the readout dead time. In order to cope with further increase in luminosity, different levels of upgrades are proposed: small improvements are possible in the short term by tuning the current system at the cost of signal-to-noise and crosstalk. In 2007, the two inner layers of the SVD2 will be replaced by similar detectors with faster readout electronics (SVD2.5) and in the long term, a major upgrade of the full silicon vertex detector (SVD3) is envisaged for the KEK Super B Factory. These upgrade scenarios will be discussed in detail from the hardware point of view along with the options under study.

KW - Belle

KW - Silicon vertex detector

KW - Upgrade

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UR - http://www.scopus.com/inward/citedby.url?scp=33751209774&partnerID=8YFLogxK

U2 - 10.1016/j.nima.2006.09.054

DO - 10.1016/j.nima.2006.09.054

M3 - Article

AN - SCOPUS:33751209774

SN - 0168-9002

VL - 569

SP - 37

EP - 40

JO - Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

JF - Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

IS - 1

ER -

Belle silicon vertex detector for the Super B Factory

Abstract

All Science Journal Classification (ASJC) codes

Keywords

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