Behavioral synthesis for easy testability in data path scheduling

Tien Chien Lee, Wayne H. Wolf, Niraj K. Jha

Research output: Chapter in Book/Report/Conference proceedingConference contribution

35 Scopus citations

Abstract

This paper presents a data path scheduling algorithm to improve testability without a priori assuming any particular test strategy. We introduce a scheduling heuristic for easy testability, based on our previous work on data path allocation for testability. We then develop a mobility path scheduling algorithm to implement this heuristic while also minimizing area. Experimental results on benchmark and example circuits show high fault coverage, short test generation time, and little or no area overhead.

Original languageEnglish (US)
Title of host publicationIEEE/ACM International Conference on Computer-Aided Design
PublisherPubl by IEEE
Pages616-619
Number of pages4
ISBN (Print)0818630108, 9780818630101
DOIs
StatePublished - 1992
EventIEEE/ACM International Conference on Computer-Aided Design - ICCAD '92 - Santa Clara, CA, USA
Duration: Nov 8 1992Nov 12 1992

Publication series

NameIEEE/ACM International Conference on Computer-Aided Design

Other

OtherIEEE/ACM International Conference on Computer-Aided Design - ICCAD '92
CitySanta Clara, CA, USA
Period11/8/9211/12/92

All Science Journal Classification (ASJC) codes

  • General Engineering

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