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Beam diagnostics and modeling in CIRFEL
J. Krishnaswamy
, I. S. Lehrman
, R. A. Hartley
, M. F. Reusch
, A. M.M. Todd
,
R. H. Austin
, D. Feldman
Physics
Princeton Materials Institute
Research output
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Article
›
peer-review
1
Scopus citations
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Beam Model
100%
Beam Diagnostics
100%
Perturbation Model
50%
Emittance Measurement
50%
Physics
Emittance
100%
Photocathode
100%