Abstract
A detailed study of electron base transport in Si/Si1-xGex/Si graded-base npn heterojunction bipolar transistors is presented. The temperature dependence from 150 to 370 K of the collector current in near-ideal devices with various base gradings is examined, and it is shown that this collector current can be modeled over the entire temperature range by a simple analytical formula. It is also shown that graded base devices with an estimated room-temperature base spreading resistance of 7 kΩ/□ have a gain of about 4000 at 89 K.
Original language | English (US) |
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Pages (from-to) | 975-978 |
Number of pages | 4 |
Journal | Technical Digest - International Electron Devices Meeting |
State | Published - Dec 1990 |
Event | 1990 International Electron Devices Meeting - San Francisco, CA, USA Duration: Dec 9 1990 → Dec 12 1990 |
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Electrical and Electronic Engineering
- Materials Chemistry