Abstract
A model for the atomic structure of the annealed Ge(111) 2 multiplied by 8 surface is proposed on the basis of intensity measurements in which the fractional order beams are attributed to a ripplelike distortion of (at least) the top two double layers in a manner consistent with charge density wave (Peierls) instabilities or compresive stress deformations derived from distributed rehybridization. The distortion is similar to that suggested for the annealed Si(111) 7 multiplied by 7 surface from a similar analysis. The superlattice is actually an 8 multiplied by 8 unit cell; the observed 2 multiplied by 8 reconstruction follows from selected structure factor cancellations owing to the specific topography of the distortion.
Original language | English (US) |
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Pages (from-to) | 1143-1145 |
Number of pages | 3 |
Journal | J VAC SCI TECHNOL |
Volume | 15 |
Issue number | 3 |
DOIs | |
State | Published - 1978 |
All Science Journal Classification (ASJC) codes
- General Engineering