Approaching the DT bound using linear codes in the short blocklength regime

Luis Salamanca, Juan Jose Murillo-Fuentes, Pablo M. Olmos, Fernando Perez-Cruz, Sergio Verdu

Research output: Contribution to journalArticle

2 Scopus citations

Abstract

The dependence-testing (DT) bound is one of the strongest achievability bounds for the binary erasure channel (BEC) in the finite block length regime. In this paper, we show that maximum likelihood decoded regular low-density parity-check (LDPC) codes with at least 5 ones per column almost achieve the DT bound. Specifically, using quasi-regular LDPC codes with block length of 256 bits, we achieve a rate that is less than 1% away from the rate predicted by the DT bound for a word error rate below $10^{-3} $. The results also indicate that the maximum-likelihood solution is computationally feasible for decoding block codes over the BEC with several hundred bits.

Original languageEnglish (US)
Article number6957577
Pages (from-to)123-126
Number of pages4
JournalIEEE Communications Letters
Volume19
Issue number2
DOIs
StatePublished - Feb 1 2015

All Science Journal Classification (ASJC) codes

  • Modeling and Simulation
  • Computer Science Applications
  • Electrical and Electronic Engineering

Keywords

  • LDPC codes
  • ML decoding
  • binary erasure channel
  • finite blocklength regime
  • random coding

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    Salamanca, L., Murillo-Fuentes, J. J., Olmos, P. M., Perez-Cruz, F., & Verdu, S. (2015). Approaching the DT bound using linear codes in the short blocklength regime. IEEE Communications Letters, 19(2), 123-126. [6957577]. https://doi.org/10.1109/LCOMM.2014.2371032